An applied noise model for scintillation-based CCD detectors in transmission electron microscopy.
C. Zietlow, J. Lindner, Sci Rep 15 (2025) 3815.
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15
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Zietlow C, Lindner J. An applied noise model for scintillation-based CCD detectors in transmission electron microscopy. Sci Rep. 2025;15(1):3815. doi:10.1038/s41598-025-85982-4
Zietlow, C., & Lindner, J. (2025). An applied noise model for scintillation-based CCD detectors in transmission electron microscopy. Sci Rep, 15(1), 3815. https://doi.org/10.1038/s41598-025-85982-4
@article{Zietlow_Lindner_2025, title={An applied noise model for scintillation-based CCD detectors in transmission electron microscopy.}, volume={15}, DOI={10.1038/s41598-025-85982-4}, number={1}, journal={Sci Rep}, author={Zietlow, Christian and Lindner, Jörg}, year={2025}, pages={3815} }
Zietlow, Christian, and Jörg Lindner. “An Applied Noise Model for Scintillation-Based CCD Detectors in Transmission Electron Microscopy.” Sci Rep 15, no. 1 (2025): 3815. https://doi.org/10.1038/s41598-025-85982-4.
C. Zietlow and J. Lindner, “An applied noise model for scintillation-based CCD detectors in transmission electron microscopy.,” Sci Rep, vol. 15, no. 1, p. 3815, 2025, doi: 10.1038/s41598-025-85982-4.
Zietlow, Christian, and Jörg Lindner. “An Applied Noise Model for Scintillation-Based CCD Detectors in Transmission Electron Microscopy.” Sci Rep, vol. 15, no. 1, 2025, p. 3815, doi:10.1038/s41598-025-85982-4.
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