On the Trustworthiness of Face Morphing Attack Detectors
R. Al-Refai, C. Biagi, C. Chen, K. Raja, R. Ramachandra, C. Busch, P. Terhörst, in: 2024 IEEE International Joint Conference on Biometrics (IJCB), IEEE, 2024.
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| English
Author
Al-Refai, Rouqaiah;
Biagi, Clara;
Chen, Cong;
Raja, Kiran;
Ramachandra, Raghavendra;
Busch, Christoph;
Terhörst, PhilippLibreCat
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Proceedings Title
2024 IEEE International Joint Conference on Biometrics (IJCB)
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Al-Refai R, Biagi C, Chen C, et al. On the Trustworthiness of Face Morphing Attack Detectors. In: 2024 IEEE International Joint Conference on Biometrics (IJCB). IEEE; 2024. doi:10.1109/ijcb62174.2024.10744447
Al-Refai, R., Biagi, C., Chen, C., Raja, K., Ramachandra, R., Busch, C., & Terhörst, P. (2024). On the Trustworthiness of Face Morphing Attack Detectors. 2024 IEEE International Joint Conference on Biometrics (IJCB). https://doi.org/10.1109/ijcb62174.2024.10744447
@inproceedings{Al-Refai_Biagi_Chen_Raja_Ramachandra_Busch_Terhörst_2024, title={On the Trustworthiness of Face Morphing Attack Detectors}, DOI={10.1109/ijcb62174.2024.10744447}, booktitle={2024 IEEE International Joint Conference on Biometrics (IJCB)}, publisher={IEEE}, author={Al-Refai, Rouqaiah and Biagi, Clara and Chen, Cong and Raja, Kiran and Ramachandra, Raghavendra and Busch, Christoph and Terhörst, Philipp}, year={2024} }
Al-Refai, Rouqaiah, Clara Biagi, Cong Chen, Kiran Raja, Raghavendra Ramachandra, Christoph Busch, and Philipp Terhörst. “On the Trustworthiness of Face Morphing Attack Detectors.” In 2024 IEEE International Joint Conference on Biometrics (IJCB). IEEE, 2024. https://doi.org/10.1109/ijcb62174.2024.10744447.
R. Al-Refai et al., “On the Trustworthiness of Face Morphing Attack Detectors,” 2024, doi: 10.1109/ijcb62174.2024.10744447.
Al-Refai, Rouqaiah, et al. “On the Trustworthiness of Face Morphing Attack Detectors.” 2024 IEEE International Joint Conference on Biometrics (IJCB), IEEE, 2024, doi:10.1109/ijcb62174.2024.10744447.
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