Characterizing Digital Factory Twins: Deriving Archetypes for Research and Industry
J. Lick, F. Kattenstroth, H. van der Valk, M. Trienens, A. Kühn, R. Dumitrescu, in: 2025 Winter Simulation Conference (WSC), IEEE, 2026.
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Author
Lick, Jonas;
Kattenstroth, Fiona;
van der Valk, Hendrik;
Trienens, Malte;
Kühn, Arno;
Dumitrescu, RomanLibreCat
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2025 Winter Simulation Conference (WSC)
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Lick J, Kattenstroth F, van der Valk H, Trienens M, Kühn A, Dumitrescu R. Characterizing Digital Factory Twins: Deriving Archetypes for Research and Industry. In: 2025 Winter Simulation Conference (WSC). IEEE; 2026. doi:10.1109/wsc68292.2025.11338979
Lick, J., Kattenstroth, F., van der Valk, H., Trienens, M., Kühn, A., & Dumitrescu, R. (2026). Characterizing Digital Factory Twins: Deriving Archetypes for Research and Industry. 2025 Winter Simulation Conference (WSC). https://doi.org/10.1109/wsc68292.2025.11338979
@inproceedings{Lick_Kattenstroth_van der Valk_Trienens_Kühn_Dumitrescu_2026, title={Characterizing Digital Factory Twins: Deriving Archetypes for Research and Industry}, DOI={10.1109/wsc68292.2025.11338979}, booktitle={2025 Winter Simulation Conference (WSC)}, publisher={IEEE}, author={Lick, Jonas and Kattenstroth, Fiona and van der Valk, Hendrik and Trienens, Malte and Kühn, Arno and Dumitrescu, Roman}, year={2026} }
Lick, Jonas, Fiona Kattenstroth, Hendrik van der Valk, Malte Trienens, Arno Kühn, and Roman Dumitrescu. “Characterizing Digital Factory Twins: Deriving Archetypes for Research and Industry.” In 2025 Winter Simulation Conference (WSC). IEEE, 2026. https://doi.org/10.1109/wsc68292.2025.11338979.
J. Lick, F. Kattenstroth, H. van der Valk, M. Trienens, A. Kühn, and R. Dumitrescu, “Characterizing Digital Factory Twins: Deriving Archetypes for Research and Industry,” 2026, doi: 10.1109/wsc68292.2025.11338979.
Lick, Jonas, et al. “Characterizing Digital Factory Twins: Deriving Archetypes for Research and Industry.” 2025 Winter Simulation Conference (WSC), IEEE, 2026, doi:10.1109/wsc68292.2025.11338979.
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