Common-path digital holography microscopy of buried semiconductor specimen
L. Göring, M. Finkeldey, N.C. Gerhardt, M.R. Hofmann, Adaptive Optics: Analysis, Methods & Systems (2016).
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Göring, Lena;
Finkeldey, Markus;
Gerhardt, Nils ChristopherLibreCat 
;
Hofmann, Martin R.
;
Hofmann, Martin R.Publishing Year
Journal Title
Adaptive Optics: Analysis, Methods & Systems
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Göring L, Finkeldey M, Gerhardt NC, Hofmann MR. Common-path digital holography microscopy of buried semiconductor specimen. Adaptive Optics: Analysis, Methods & Systems. Published online 2016. doi:10.1364/3d.2016.jw4a.40
Göring, L., Finkeldey, M., Gerhardt, N. C., & Hofmann, M. R. (2016). Common-path digital holography microscopy of buried semiconductor specimen. Adaptive Optics: Analysis, Methods & Systems. https://doi.org/10.1364/3d.2016.jw4a.40
@article{Göring_Finkeldey_Gerhardt_Hofmann_2016, title={Common-path digital holography microscopy of buried semiconductor specimen}, DOI={10.1364/3d.2016.jw4a.40}, journal={Adaptive Optics: Analysis, Methods & Systems}, author={Göring, Lena and Finkeldey, Markus and Gerhardt, Nils Christopher and Hofmann, Martin R.}, year={2016} }
Göring, Lena, Markus Finkeldey, Nils Christopher Gerhardt, and Martin R. Hofmann. “Common-Path Digital Holography Microscopy of Buried Semiconductor Specimen.” Adaptive Optics: Analysis, Methods & Systems, 2016. https://doi.org/10.1364/3d.2016.jw4a.40.
L. Göring, M. Finkeldey, N. C. Gerhardt, and M. R. Hofmann, “Common-path digital holography microscopy of buried semiconductor specimen,” Adaptive Optics: Analysis, Methods & Systems, 2016, doi: 10.1364/3d.2016.jw4a.40.
Göring, Lena, et al. “Common-Path Digital Holography Microscopy of Buried Semiconductor Specimen.” Adaptive Optics: Analysis, Methods & Systems, 2016, doi:10.1364/3d.2016.jw4a.40.
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