Screening effects in InAs quantum-dot structures observed by photoluminescence and capacitance-voltage spectra
S. Lüttjohann, C. Meier, A. Lorke, D. Reuter, A.D. Wieck, Applied Physics Letters 87 (2005).
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Journal Article
| Published
| English
Author
Lüttjohann, Stephan;
Meier, CedrikLibreCat 
;
Lorke, Axel;
Reuter, Dirk;
Wieck, Andreas D.
;
Lorke, Axel;
Reuter, Dirk;
Wieck, Andreas D.Department
Publishing Year
Journal Title
Applied Physics Letters
Volume
87
Issue
16
Article Number
163117
LibreCat-ID
Cite this
Lüttjohann S, Meier C, Lorke A, Reuter D, Wieck AD. Screening effects in InAs quantum-dot structures observed by photoluminescence and capacitance-voltage spectra. Applied Physics Letters. 2005;87(16). doi:10.1063/1.2112192
Lüttjohann, S., Meier, C., Lorke, A., Reuter, D., & Wieck, A. D. (2005). Screening effects in InAs quantum-dot structures observed by photoluminescence and capacitance-voltage spectra. Applied Physics Letters, 87(16). https://doi.org/10.1063/1.2112192
@article{Lüttjohann_Meier_Lorke_Reuter_Wieck_2005, title={Screening effects in InAs quantum-dot structures observed by photoluminescence and capacitance-voltage spectra}, volume={87}, DOI={10.1063/1.2112192}, number={16163117}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Lüttjohann, Stephan and Meier, Cedrik and Lorke, Axel and Reuter, Dirk and Wieck, Andreas D.}, year={2005} }
Lüttjohann, Stephan, Cedrik Meier, Axel Lorke, Dirk Reuter, and Andreas D. Wieck. “Screening Effects in InAs Quantum-Dot Structures Observed by Photoluminescence and Capacitance-Voltage Spectra.” Applied Physics Letters 87, no. 16 (2005). https://doi.org/10.1063/1.2112192.
S. Lüttjohann, C. Meier, A. Lorke, D. Reuter, and A. D. Wieck, “Screening effects in InAs quantum-dot structures observed by photoluminescence and capacitance-voltage spectra,” Applied Physics Letters, vol. 87, no. 16, 2005.
Lüttjohann, Stephan, et al. “Screening Effects in InAs Quantum-Dot Structures Observed by Photoluminescence and Capacitance-Voltage Spectra.” Applied Physics Letters, vol. 87, no. 16, 163117, AIP Publishing, 2005, doi:10.1063/1.2112192.
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