A holistic approach to test-driven model checking

F. Belli, B. Güldali, in: Proceedings of the Conference on Innovations in Applied Artificial Intelligence and Expert Systems (IEA/AIE 2005), Bari (Italy), Springer, Berlin/Heidelberg, 2005, pp. 321–331.

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Conference Paper | English
Author
Belli, Fevzi; Güldali, Baris
Publishing Year
Proceedings Title
Proceedings of the conference on Innovations in Applied Artificial Intelligence and Expert Systems (IEA/AIE 2005), Bari (Italy)
forms.conference.field.series_title_volume.label
LNCS
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321-331
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Belli F, Güldali B. A holistic approach to test-driven model checking. In: Proceedings of the Conference on Innovations in Applied Artificial Intelligence and Expert Systems (IEA/AIE 2005), Bari (Italy). LNCS. Berlin/Heidelberg: Springer; 2005:321-331.
Belli, F., & Güldali, B. (2005). A holistic approach to test-driven model checking. In Proceedings of the conference on Innovations in Applied Artificial Intelligence and Expert Systems (IEA/AIE 2005), Bari (Italy) (pp. 321–331). Berlin/Heidelberg: Springer.
@inproceedings{Belli_Güldali_2005, place={Berlin/Heidelberg}, series={LNCS}, title={A holistic approach to test-driven model checking}, booktitle={Proceedings of the conference on Innovations in Applied Artificial Intelligence and Expert Systems (IEA/AIE 2005), Bari (Italy)}, publisher={Springer}, author={Belli, Fevzi and Güldali, Baris}, year={2005}, pages={321–331}, collection={LNCS} }
Belli, Fevzi, and Baris Güldali. “A Holistic Approach to Test-Driven Model Checking.” In Proceedings of the Conference on Innovations in Applied Artificial Intelligence and Expert Systems (IEA/AIE 2005), Bari (Italy), 321–31. LNCS. Berlin/Heidelberg: Springer, 2005.
F. Belli and B. Güldali, “A holistic approach to test-driven model checking,” in Proceedings of the conference on Innovations in Applied Artificial Intelligence and Expert Systems (IEA/AIE 2005), Bari (Italy), 2005, pp. 321–331.
Belli, Fevzi, and Baris Güldali. “A Holistic Approach to Test-Driven Model Checking.” Proceedings of the Conference on Innovations in Applied Artificial Intelligence and Expert Systems (IEA/AIE 2005), Bari (Italy), Springer, 2005, pp. 321–31.

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