UML 2.0 - Overview and Perspectives in SoC Design
T. Schattkowsky, in: Proceedings of the Conference on Design, Automation and Test in Europe (DATE 2005), Munich (Germany), IEEE Computer Society, Washington, DC, USA, 2005, pp. 832–833.
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Schattkowsky, Tim
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Proceedings Title
Proceedings of the conference on Design, Automation and Test in Europe (DATE 2005), Munich (Germany)
Volume
2
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832-833
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Schattkowsky T. UML 2.0 - Overview and Perspectives in SoC Design. In: Proceedings of the Conference on Design, Automation and Test in Europe (DATE 2005), Munich (Germany). Vol 2. Washington, DC, USA: IEEE Computer Society; 2005:832-833. doi:http://dx.doi.org/10.1109/DATE.2005.320
Schattkowsky, T. (2005). UML 2.0 - Overview and Perspectives in SoC Design. In Proceedings of the conference on Design, Automation and Test in Europe (DATE 2005), Munich (Germany) (Vol. 2, pp. 832–833). Washington, DC, USA: IEEE Computer Society. http://dx.doi.org/10.1109/DATE.2005.320
@inproceedings{Schattkowsky_2005, place={Washington, DC, USA}, title={UML 2.0 - Overview and Perspectives in SoC Design}, volume={2}, DOI={http://dx.doi.org/10.1109/DATE.2005.320}, booktitle={Proceedings of the conference on Design, Automation and Test in Europe (DATE 2005), Munich (Germany)}, publisher={IEEE Computer Society}, author={Schattkowsky, Tim}, year={2005}, pages={832–833} }
Schattkowsky, Tim. “UML 2.0 - Overview and Perspectives in SoC Design.” In Proceedings of the Conference on Design, Automation and Test in Europe (DATE 2005), Munich (Germany), 2:832–33. Washington, DC, USA: IEEE Computer Society, 2005. http://dx.doi.org/10.1109/DATE.2005.320.
T. Schattkowsky, “UML 2.0 - Overview and Perspectives in SoC Design,” in Proceedings of the conference on Design, Automation and Test in Europe (DATE 2005), Munich (Germany), 2005, vol. 2, pp. 832–833.
Schattkowsky, Tim. “UML 2.0 - Overview and Perspectives in SoC Design.” Proceedings of the Conference on Design, Automation and Test in Europe (DATE 2005), Munich (Germany), vol. 2, IEEE Computer Society, 2005, pp. 832–33, doi:http://dx.doi.org/10.1109/DATE.2005.320.
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