Nanoimprint-induced effects on electrical and optical properties of quantum well structures

S. Zankovych, I. Maximov, I. Shorubalko, J. Seekamp, M. Beck, S. Romanov, D. Reuter, P. Schafmeister, A.D. Wieck, J. Ahopelto, C.M. Sotomayor Torres, L. Montelius, Microelectronic Engineering (2003) 214–220.

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Journal Article | Published | English
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Zankovych, S.; Maximov, I.; Shorubalko, I.; Seekamp, J.; Beck, M.; Romanov, S.; Reuter, DirkLibreCat; Schafmeister, P.; Wieck, A.D.; Ahopelto, J.; Sotomayor Torres, C.M.; Montelius, L.
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Microelectronic Engineering
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214-220
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Zankovych S, Maximov I, Shorubalko I, et al. Nanoimprint-induced effects on electrical and optical properties of quantum well structures. Microelectronic Engineering. 2003:214-220. doi:10.1016/s0167-9317(03)00074-1
Zankovych, S., Maximov, I., Shorubalko, I., Seekamp, J., Beck, M., Romanov, S., … Montelius, L. (2003). Nanoimprint-induced effects on electrical and optical properties of quantum well structures. Microelectronic Engineering, 214–220. https://doi.org/10.1016/s0167-9317(03)00074-1
@article{Zankovych_Maximov_Shorubalko_Seekamp_Beck_Romanov_Reuter_Schafmeister_Wieck_Ahopelto_et al._2003, title={Nanoimprint-induced effects on electrical and optical properties of quantum well structures}, DOI={10.1016/s0167-9317(03)00074-1}, journal={Microelectronic Engineering}, author={Zankovych, S. and Maximov, I. and Shorubalko, I. and Seekamp, J. and Beck, M. and Romanov, S. and Reuter, Dirk and Schafmeister, P. and Wieck, A.D. and Ahopelto, J. and et al.}, year={2003}, pages={214–220} }
Zankovych, S., I. Maximov, I. Shorubalko, J. Seekamp, M. Beck, S. Romanov, Dirk Reuter, et al. “Nanoimprint-Induced Effects on Electrical and Optical Properties of Quantum Well Structures.” Microelectronic Engineering, 2003, 214–20. https://doi.org/10.1016/s0167-9317(03)00074-1.
S. Zankovych et al., “Nanoimprint-induced effects on electrical and optical properties of quantum well structures,” Microelectronic Engineering, pp. 214–220, 2003.
Zankovych, S., et al. “Nanoimprint-Induced Effects on Electrical and Optical Properties of Quantum Well Structures.” Microelectronic Engineering, 2003, pp. 214–20, doi:10.1016/s0167-9317(03)00074-1.

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