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264 Publications
2023 | Conference Abstract | LibreCat-ID: 48961
A 28-Gb/s 27.2mW NRZ Full-Rate Bang-Bang Clock and Data Recovery in 22 nm FD-SOI CMOS Technology
M. Iftekhar, H. Gowda, P. Kneuper, B. Sadiye, W. Müller, C. Scheytt, in: 2023 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), 2023.
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M. Iftekhar, H. Gowda, P. Kneuper, B. Sadiye, W. Müller, C. Scheytt, in: 2023 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), 2023.
2022 | Conference Paper | LibreCat-ID: 29302
The Scale4Edge RISC-V Ecosystem
W. Ecker, P. Adelt, W. Müller, R. Heckmann, M. Krstic, V. Herdt, R. Drechsler, G. Angst, R. Wimmer, A. Mauderer, R. Stahl, K. Emrich, D. Mueller-Gritschneder, B. Becker, P. Scholl, E. Jentzsch, J. Schlamelcher, K. Grüttner, P.P. Bernardo, O. Brinkmann, M. Damian, J. Oppermann, A. Koch, J. Bormann, J. Partzsch, C. Mayr, W. Kunz, in: In Proceedings of the Design Automation and Test Conference and Exhibition (DATE 2022), 2022.
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W. Ecker, P. Adelt, W. Müller, R. Heckmann, M. Krstic, V. Herdt, R. Drechsler, G. Angst, R. Wimmer, A. Mauderer, R. Stahl, K. Emrich, D. Mueller-Gritschneder, B. Becker, P. Scholl, E. Jentzsch, J. Schlamelcher, K. Grüttner, P.P. Bernardo, O. Brinkmann, M. Damian, J. Oppermann, A. Koch, J. Bormann, J. Partzsch, C. Mayr, W. Kunz, in: In Proceedings of the Design Automation and Test Conference and Exhibition (DATE 2022), 2022.
2021 | Conference Paper | LibreCat-ID: 32125
Register and Instruction Coverage Analysis for Different RISC-V ISA Modules
P. Adelt, B. Koppelmann, W. Müller, C. Scheytt, in: MBMV 2021 - Methods and Description Languages for Modelling and Verification of Circuits and Systems; GMM/ITG/GI-Workshop, VDE, Munich, DE, 2021.
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P. Adelt, B. Koppelmann, W. Müller, C. Scheytt, in: MBMV 2021 - Methods and Description Languages for Modelling and Verification of Circuits and Systems; GMM/ITG/GI-Workshop, VDE, Munich, DE, 2021.
2021 | Conference Paper | LibreCat-ID: 32132
QEMU zur Simulation von Worst-Case-Ausführungszeiten
P. Adelt, B. Koppelmann, W. Müller, C. Scheytt, in: MBMV 2021 - Methods and Description Languages for Modelling and Verification of Circuits and Systems; GMM/ITG/GI-Workshop, VDE, Munich, DE, 2021.
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P. Adelt, B. Koppelmann, W. Müller, C. Scheytt, in: MBMV 2021 - Methods and Description Languages for Modelling and Verification of Circuits and Systems; GMM/ITG/GI-Workshop, VDE, Munich, DE, 2021.
2021 | Conference Paper | LibreCat-ID: 23992
Register and Instruction Coverage Analysis for Different RISC-V ISA Modules
P. Adelt, B. Koppelmann, W. Müller, C. Scheytt, in: Workshop Methoden Und Beschreibungssprachen Zur Modellierung Und Verifikation von Schaltungen Und Systemen (MBMV 2021), 2021.
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P. Adelt, B. Koppelmann, W. Müller, C. Scheytt, in: Workshop Methoden Und Beschreibungssprachen Zur Modellierung Und Verifikation von Schaltungen Und Systemen (MBMV 2021), 2021.
2020 | Conference Paper | LibreCat-ID: 24027
A Scalable Platform for QEMU Based Fault Effect Analysis for RISC-V Hardware Architectures
P. Adelt, B. Koppelmann, W. Müller, C. Scheytt, in: MBMV 2020 - Methods and Description Languages for Modelling and Verification of Circuits and Systems; GMM/ITG/GI-Workshop, Stuttgart, DE, 2020.
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P. Adelt, B. Koppelmann, W. Müller, C. Scheytt, in: MBMV 2020 - Methods and Description Languages for Modelling and Verification of Circuits and Systems; GMM/ITG/GI-Workshop, Stuttgart, DE, 2020.
2019 | Conference Paper | LibreCat-ID: 24058
RISC-V Extensions for Bit Manipulation Instructions
B. Koppelmann, P. Adelt, W. Müller, C. Scheytt, in: 29th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS), Rhodos, Griechenland, 2019.
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B. Koppelmann, P. Adelt, W. Müller, C. Scheytt, in: 29th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS), Rhodos, Griechenland, 2019.
2019 | Conference Paper | LibreCat-ID: 24060
Analyse sicherheitskritischer Software für RISC-V Prozessoren
P. Adelt, B. Koppelmann, W. Müller, C. Scheytt, in: MBMV 2019-22.Workshop Methoden Und Beschreibungssprachen Zur Modellierung Und Verifikation von Schaltungen Und Systemen (MBMV 2019), Kaiserslautern, DE, 2019.
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P. Adelt, B. Koppelmann, W. Müller, C. Scheytt, in: MBMV 2019-22.Workshop Methoden Und Beschreibungssprachen Zur Modellierung Und Verifikation von Schaltungen Und Systemen (MBMV 2019), Kaiserslautern, DE, 2019.
2019 | Conference Paper | LibreCat-ID: 24061
QEMU for Dynamic Memory Analysis of Security Sensitive Software
P. Adelt, B. Koppelmann, W. Müller, C. Scheytt, B. Driessen, in: 2nd International Workshop on Embedded Software for Industrial IoT in Conjunction with DATE 2019, Florence, Italy, 2019, pp. 32–34.
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P. Adelt, B. Koppelmann, W. Müller, C. Scheytt, B. Driessen, in: 2nd International Workshop on Embedded Software for Industrial IoT in Conjunction with DATE 2019, Florence, Italy, 2019, pp. 32–34.
2019 | Journal Article | LibreCat-ID: 24063
QEMU Support for RISC-V: Current State and Future Releases
P. Adelt, B. Koppelmann, W. Müller, C. Scheytt, 2nd International Workshop on RISC-V Research Activities (Presentation) (2019).
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P. Adelt, B. Koppelmann, W. Müller, C. Scheytt, 2nd International Workshop on RISC-V Research Activities (Presentation) (2019).
2019 | Book (Editor) | LibreCat-ID: 53596
Proceedings of the 2nd International Workshop on Embedded Software for Industrial IoT - ESIIT
O. Bringmann, W. Ecker, W. Müller, D. Müller-Gridschneder, eds., Proceedings of the 2nd International Workshop on Embedded Software for Industrial IoT - ESIIT, Florence, Italy, 2019.
LibreCat
O. Bringmann, W. Ecker, W. Müller, D. Müller-Gridschneder, eds., Proceedings of the 2nd International Workshop on Embedded Software for Industrial IoT - ESIIT, Florence, Italy, 2019.
2018 | Journal Article | LibreCat-ID: 24194
Current and Future RISC-V Activities for Virtual Prototyping and Chip Design
P. Adelt, B. Koppelmann, W. Müller, International Workshop on RISC-V Research Activities Presentation (2018).
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P. Adelt, B. Koppelmann, W. Müller, International Workshop on RISC-V Research Activities Presentation (2018).
2018 | Conference Paper | LibreCat-ID: 24196
Analog fault simulation automation at schematic level with random sampling techniques
L. Wu, M.K. Hussain, S. Abughannam, W. Müller, C. Scheytt, W. Ecker, in: 2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)) , IEEE, Italy/Taormina, 2018.
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L. Wu, M.K. Hussain, S. Abughannam, W. Müller, C. Scheytt, W. Ecker, in: 2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)) , IEEE, Italy/Taormina, 2018.
2018 | Book (Editor) | LibreCat-ID: 53595
Proceedings of the 1st International Workshop on Embedded Software for Industrial IoT - ESIIT
O. Bringmann, W. Ecker, W. Müller, D. Müller-Gridschneder, eds., Proceedings of the 1st International Workshop on Embedded Software for Industrial IoT - ESIIT, Dresden, Germany, 2018.
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O. Bringmann, W. Ecker, W. Müller, D. Müller-Gridschneder, eds., Proceedings of the 1st International Workshop on Embedded Software for Industrial IoT - ESIIT, Dresden, Germany, 2018.
2017 | Conference Paper | LibreCat-ID: 24220
Automatisierte Fehlerinjektion zur Entwicklung sicherer Mikrocontrolleranwendungen auf der Basis virtueller Plattformen
P. Adelt, B. Koppelmann, W. Müller, D. Mueller-Gritschneder, B. Kleinjohann, C. Scheytt, in: Tagungsband des Wissenschaftsforums Intelligente Technische Systeme, Verlagsschriftenreihe des Heinz Nixdorf Instituts, Germany, Paderborn, 2017.
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P. Adelt, B. Koppelmann, W. Müller, D. Mueller-Gritschneder, B. Kleinjohann, C. Scheytt, in: Tagungsband des Wissenschaftsforums Intelligente Technische Systeme, Verlagsschriftenreihe des Heinz Nixdorf Instituts, Germany, Paderborn, 2017.
2017 | Conference Paper | LibreCat-ID: 24223
SPICE-Level Fault Injection with Likelihood Weighted Random Sampling - A Case Study
L. Wu, S. Abughannam, W. Müller, C. Scheytt, W. Ecker, in: 2nd Workshop on Resiliency in Embedded Electronic Systems (REES), Lausanne, Switzerland, 2017, p. 68.
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L. Wu, S. Abughannam, W. Müller, C. Scheytt, W. Ecker, in: 2nd Workshop on Resiliency in Embedded Electronic Systems (REES), Lausanne, Switzerland, 2017, p. 68.
2017 | Conference Paper | LibreCat-ID: 24224
ANALISA - A Tool for Static Instruction Set Analysis
P. Adelt, B. Koppelmann, W. Müller, B. Kleinjohann, C. Scheytt, in: Design Automation and Testing in Europe (DATE), University Booth Interactive Presentation, Lausanne, CH, 2017.
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P. Adelt, B. Koppelmann, W. Müller, B. Kleinjohann, C. Scheytt, in: Design Automation and Testing in Europe (DATE), University Booth Interactive Presentation, Lausanne, CH, 2017.
2017 | Conference Paper | LibreCat-ID: 24225
An Automatic Injection Framework for Safety Assessements of Embedded Software Binaries
P. Adelt, B. Koppelmann, W. Müller, B. Kleinjohann, C. Scheytt, in: 2nd Workshop on Resiliency in Embedded Electronic Systems (REES) , Lausanne, Switzerland, 2017, p. 44.
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P. Adelt, B. Koppelmann, W. Müller, B. Kleinjohann, C. Scheytt, in: 2nd Workshop on Resiliency in Embedded Electronic Systems (REES) , Lausanne, Switzerland, 2017, p. 44.
2016 | Conference Paper | LibreCat-ID: 24264
Fast Dynamic Fault Injection for Virtual Microcontroller Platforms
P. Adelt, B. Koppelmann, W. Müller, M. Becker, B. Kleinjohann, C. Scheytt, in: Proceedings of the IEEE/IFIP International Conference on VLSI (VLSI-SOC), Tallin, Estonia, 2016.
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P. Adelt, B. Koppelmann, W. Müller, M. Becker, B. Kleinjohann, C. Scheytt, in: Proceedings of the IEEE/IFIP International Conference on VLSI (VLSI-SOC), Tallin, Estonia, 2016.
2016 | Conference Paper | LibreCat-ID: 24263
Fault Injection and Mixed-Level Simulation for Analog Circuits - A Case Study
S. Abughannam, L. Wu, W. Müller, C. Scheytt, W. Ecker, C. Novello, in: Analog 2016 - VDE, 2016.
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S. Abughannam, L. Wu, W. Müller, C. Scheytt, W. Ecker, C. Novello, in: Analog 2016 - VDE, 2016.