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28 Publications
2011 | Journal Article | LibreCat-ID: 4379
Garralaga Rojas E, Terheiden B, Plagwitz H, et al. Lift-off of mesoporous layers by electrochemical etching on Si (100) substrates with miscut of 6° off towards (111). Thin Solid Films. 2011;520(1):606-609. doi:10.1016/j.tsf.2011.07.063
LibreCat
| DOI
2011 | Journal Article | LibreCat-ID: 13561
Berth G, Hahn W, Wiedemeier V, Zrenner A, Sanna S, Schmidt WG. Imaging of the Ferroelectric Domain Structures by Confocal Raman Spectroscopy. Ferroelectrics. 2011;420:44-48. doi:10.1080/00150193.2011.594774
LibreCat
| DOI
2011 | Journal Article | LibreCat-ID: 4543
Sanna S, Berth G, Hahn W, Widhalm A, Zrenner A, Schmidt WG. Localised Phonon Modes at LiNbO3(0001) Surfaces. Ferroelectrics. 2011;419(1):1-8. doi:10.1080/00150193.2011.594396
LibreCat
| DOI
2010 | Journal Article | LibreCat-ID: 4548
Herres-Pawlis S, Berth G, Wiedemeier V, Schmidt L, Zrenner A, Warnecke H-J. Oxygen sensing by fluorescence quenching of [Cu(btmgp)I]. Journal of Luminescence. 2010;130(10):1958-1962. doi:10.1016/j.jlumin.2010.05.012
LibreCat
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2010 | Journal Article | LibreCat-ID: 4549
Larramendi EM, Berth G, Wiedemeier V, et al. Intensity enhancement of Te Raman modes by laser damage in ZnTe epilayers. Semiconductor Science and Technology. 2010;25(7). doi:10.1088/0268-1242/25/7/075003
LibreCat
| DOI
2010 | Journal Article | LibreCat-ID: 6619
Warnecke H-J, Bothe D, Zrenner A, Berth G, Hüsch K-P. Modellbasierte Bestimmung lokal gültiger Kinetiken chemischer Reaktionen in Flüssigphase mittels Flachbettmikroreaktor*. Chemie Ingenieur Technik. 2010;82(3):251-258. doi:10.1002/cite.200900169
LibreCat
| DOI
2009 | Journal Article | LibreCat-ID: 4553
Berth G, Wiedemeier V, Hüsch K-P, et al. Imaging of Ferroelectric Micro-Domains in X-Cut Lithium Niobate by Confocal Second Harmonic Microscopy. Ferroelectrics. 2009;389(1):132-141. doi:10.1080/00150190902993267
LibreCat
| DOI
2008 | Journal Article | LibreCat-ID: 4555
Panfilova M, Pawlis A, Arens C, et al. Micro-Raman imaging and micro-photoluminescence measurements of strain in ZnMgSe/ZnSe microdiscs. Microelectronics Journal. 2008;40(2):221-223. doi:10.1016/j.mejo.2008.07.056
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| DOI