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151 Publications
2024 | Conference Paper | LibreCat-ID: 52744
Jafarzadeh H, Klemme F, Amrouch H, Hellebrand S, Wunderlich H-J. Time and Space Optimized Storage-based BIST under Multiple Voltages and Variations. In: European Test Symposium, The Hague, Netherlands, May 20-24, 2024. IEEE; :6.
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2024 | Conference Paper | LibreCat-ID: 52742
Jafarzadeh H, Klemme F, Amrouch H, Hellebrand S, Wunderlich H-J. Vmin Testing under Variations: Defect vs. Fault Coverage. In: IEEE Latin American Test Symposium (LATS), Maceió, Brazil, April 9-12, 2024. IEEE; :6.
LibreCat
2024 | Conference Paper | LibreCat-ID: 52743
Hellebrand S, Sadeghi-Kohan S, Wunderlich H-J. Functional Safety and Reliability of Interconnects throughout the Silicon Life Cycle. In: International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024. ; :1.
LibreCat
2024 | Conference Paper | LibreCat-ID: 52745
Wunderlich H-J, Jafarzadeh H, Hellebrand S. Robust Test of Small Delay Faults under PVT-Variations. In: International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024. ; :1.
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2024 | Misc | LibreCat-ID: 50284
Stiballe A, Reimer JD, Sadeghi-Kohan S, Hellebrand S. Modeling Crosstalk-Induced Interconnect Delay with Polynomial Regression. 37. ITG / GMM / GI -Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’24), Feb. 2024; 2024.
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