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151 Publications
2024 | Conference Paper | LibreCat-ID: 52744
Jafarzadeh, Hanieh, et al. “Time and Space Optimized Storage-Based BIST under Multiple Voltages and Variations.” European Test Symposium, The Hague, Netherlands, May 20-24, 2024, IEEE, p. 6.
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2024 | Conference Paper | LibreCat-ID: 52742
Jafarzadeh, Hanieh, et al. “Vmin Testing under Variations: Defect vs. Fault Coverage.” IEEE Latin American Test Symposium (LATS), Maceió, Brazil, April 9-12, 2024, IEEE, p. 6.
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2024 | Conference Paper | LibreCat-ID: 52743
Hellebrand, Sybille, et al. “Functional Safety and Reliability of Interconnects throughout the Silicon Life Cycle.” International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024, p. 1.
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2024 | Conference Paper | LibreCat-ID: 52745
Wunderlich, Hans-Joachim, et al. “Robust Test of Small Delay Faults under PVT-Variations.” International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024, p. 1.
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2024 | Misc | LibreCat-ID: 50284
Stiballe, Alisa, et al. Modeling Crosstalk-Induced Interconnect Delay with Polynomial Regression. 37. ITG / GMM / GI -Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’24), Feb. 2024, 2024.
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