Time and Space Optimized Storage-based BIST under Multiple Voltages and Variations
H. Jafarzadeh, F. Klemme, H. Amrouch, S. Hellebrand, H.-J. Wunderlich, in: European Test Symposium, The Hague, Netherlands, May 20-24, 2024, IEEE, n.d., p. 6.
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Conference Paper
| Accepted
| English
Author
Jafarzadeh, Hanieh;
Klemme, Florian;
Amrouch, Hussam;
Hellebrand, SybilleLibreCat 
;
Wunderlich, Hans-Joachim
;
Wunderlich, Hans-JoachimDepartment
Publishing Year
Proceedings Title
European Test Symposium, The Hague, Netherlands, May 20-24, 2024
Page
6
Conference
IEEE European Test Symposium
Conference Location
The Hague, NL
Conference Date
2024-05-20 – 2024-05-24
LibreCat-ID
Cite this
Jafarzadeh H, Klemme F, Amrouch H, Hellebrand S, Wunderlich H-J. Time and Space Optimized Storage-based BIST under Multiple Voltages and Variations. In: European Test Symposium, The Hague, Netherlands, May 20-24, 2024. IEEE; :6.
Jafarzadeh, H., Klemme, F., Amrouch, H., Hellebrand, S., & Wunderlich, H.-J. (n.d.). Time and Space Optimized Storage-based BIST under Multiple Voltages and Variations. European Test Symposium, The Hague, Netherlands, May 20-24, 2024, 6.
@inproceedings{Jafarzadeh_Klemme_Amrouch_Hellebrand_Wunderlich, title={Time and Space Optimized Storage-based BIST under Multiple Voltages and Variations}, booktitle={European Test Symposium, The Hague, Netherlands, May 20-24, 2024}, publisher={IEEE}, author={Jafarzadeh, Hanieh and Klemme, Florian and Amrouch, Hussam and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, pages={6} }
Jafarzadeh, Hanieh, Florian Klemme, Hussam Amrouch, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Time and Space Optimized Storage-Based BIST under Multiple Voltages and Variations.” In European Test Symposium, The Hague, Netherlands, May 20-24, 2024, 6. IEEE, n.d.
H. Jafarzadeh, F. Klemme, H. Amrouch, S. Hellebrand, and H.-J. Wunderlich, “Time and Space Optimized Storage-based BIST under Multiple Voltages and Variations,” in European Test Symposium, The Hague, Netherlands, May 20-24, 2024, The Hague, NL, p. 6.
Jafarzadeh, Hanieh, et al. “Time and Space Optimized Storage-Based BIST under Multiple Voltages and Variations.” European Test Symposium, The Hague, Netherlands, May 20-24, 2024, IEEE, p. 6.
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