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7 Publications


2024 | Misc | LibreCat-ID: 50284
Stiballe, A., Reimer, J. D., Sadeghi-Kohan, S., & Hellebrand, S. (2024). Modeling Crosstalk-induced Interconnect Delay with Polynomial Regression. 37. ITG / GMM / GI -Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”  (TuZ’24), Feb. 2024.
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2023 | Misc | LibreCat-ID: 35204
Ghazal, A., Sadeghi-Kohan, S., Reimer, J. D., & Hellebrand, S. (2023). On Cryptography Effects on Interconnect Reliability. 35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023.
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2023 | Conference Paper | LibreCat-ID: 41875
Badran, A., Sadeghi-Kohan, S., Reimer, J. D., & Hellebrand, S. (2023). Approximate Computing: Balancing Performance, Power, Reliability, and Safety. 28th IEEE European Test Symposium (ETS’23), May 2023.
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2023 | Conference Paper | LibreCat-ID: 46738
Sadeghi-Kohan, S., Reimer, J. D., Hellebrand, S., & Wunderlich, H.-J. (2023). Optimizing the Streaming of Sensor Data with Approximate Communication. IEEE Asian Test Symposium (ATS’23), October 2023. IEEE Asian Test Symposium (ATS’23).
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2023 | Conference Paper | LibreCat-ID: 45830
Jafarzadeh, H., Klemme, F., Reimer, J. D., Najafi Haghi, Z. P., Amrouch, H., Hellebrand, S., & Wunderlich, H.-J. (2023). Robust Pattern Generation for Small Delay Faults under Process Variations. IEEE International Test Conference (ITC’23), Anaheim, USA, October 2023. IEEE International Test Conference (ITC’23), Anaheim, USA.
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2020 | Conference Paper | LibreCat-ID: 19422
Sprenger, A., Sadeghi-Kohan, S., Reimer, J. D., & Hellebrand, S. (2020). Variation-Aware Test for Logic Interconnects using Neural Networks - A Case Study. IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20), October 2020.
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2020 | Conference Paper | LibreCat-ID: 19421
Holst, S., Kampmann, M., Sprenger, A., Reimer, J. D., Hellebrand, S., Wunderlich, H.-J., & Weng, X. (2020). Logic Fault Diagnosis of Hidden Delay Defects. IEEE International Test Conference (ITC’20), November 2020.
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