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347 Publications


2001 | Journal Article | LibreCat-ID: 13847
Hingerl, K., Balderas-Navarro, R. ., Bonanni, A., Tichopadek, P., & Schmidt, W. G. (2001). On the origin of resonance features in reflectance difference data of silicon. Applied Surface Science, 175176, 769–776. https://doi.org/10.1016/s0169-4332(01)00114-3
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2001 | Journal Article | LibreCat-ID: 13849
Schmidt, W. G., Bechstedt, F., & Bernholc, J. (2001). Terrace and step contributions to the optical anisotropy of Si(001) surfaces. Physical Review B, 63. https://doi.org/10.1103/physrevb.63.045322
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2000 | Journal Article | LibreCat-ID: 13756
Pulci, O., Lüdge, K., Schmidt, W. G., & Bechstedt, F. (2000). First-principles study of (2×1) and (2×2) phosphorus-rich InP(001) surfaces. Surface Science, 464, 272–282. https://doi.org/10.1016/s0039-6028(00)00729-9
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2000 | Journal Article | LibreCat-ID: 13757
Schmidt, W. G., Bernholc, J., & Bechstedt, F. (2000). (001) Surfaces of GaP and InP: structural motifs, electronic states and optical signatures. Applied Surface Science, 166, 179–184. https://doi.org/10.1016/s0169-4332(00)00406-2
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2000 | Journal Article | LibreCat-ID: 13758
Frisch, A. M., Vogt, P., Visbeck, S., Hannappel, T., Willig, F., Braun, W., … Esser, N. (2000). Angle Resolved Photoemission Spectroscopy of the InP(001) surface. Applied Surface Science, 166, 224–230. https://doi.org/10.1016/s0169-4332(00)00431-1
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2000 | Journal Article | LibreCat-ID: 13759
Schmidt, W. G., Mirbt, S., & Bechstedt, F. (2000). Surface phase diagram of (2×4) and (4×2) reconstructions of GaAs(001). Physical Review B, 62(12), 8087–8091. https://doi.org/10.1103/physrevb.62.8087
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2000 | Journal Article | LibreCat-ID: 13760
Schmidt, W. G., Esser, N., Frisch, A. M., Vogt, P., Bernholc, J., Bechstedt, F., … Richter, W. (2000). Understanding reflectance anisotropy: Surface-state signatures and bulk-related features in the optical spectrum ofInP(001)(2×4). Physical Review B, 61, R16335–R16338. https://doi.org/10.1103/physrevb.61.r16335
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2000 | Journal Article | LibreCat-ID: 13761
Schmidt, W. G., Bechstedt, F., & Bernholc, J. (2000). Understanding reflectance anisotropy: Surface-state signatures and bulk-related features. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 18(4). https://doi.org/10.1116/1.1305289
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2000 | Journal Article | LibreCat-ID: 13762
Schmidt, W. G., & Bernholc, J. (2000). Step-induced optical anisotropy of Si(111):H surfaces. Physical Review B, 61(11), 7604–7608. https://doi.org/10.1103/physrevb.61.7604
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2000 | Book Chapter | LibreCat-ID: 13763
Bernholc, J., Briggs, E. L., Bungaro, C., Buongiorno Nardelli, M., Fattebert, J.-L., Rapcewicz, K., … Zhao, Q. (2000). Large-Scale Applications of Real-Space Multigrid Methods to Surfaces, Nanotubes and Quantum Transport. In Computer Simulation of Materials at Atomic Level (Vol. 1, pp. 685–701). physica status solidi (b). https://doi.org/10.1002/3527603107.ch33
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