On the origin of resonance features in reflectance difference data of silicon
K. Hingerl, R.. Balderas-Navarro, A. Bonanni, P. Tichopadek, W.G. Schmidt, Applied Surface Science 175–176 (2001) 769–776.
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Journal Article
| Published
| English
Author
Hingerl, K;
Balderas-Navarro, R.E;
Bonanni, A;
Tichopadek, P;
Schmidt, Wolf GeroLibreCat 
Publishing Year
Journal Title
Applied Surface Science
Volume
175-176
Page
769-776
ISSN
LibreCat-ID
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Hingerl K, Balderas-Navarro R., Bonanni A, Tichopadek P, Schmidt WG. On the origin of resonance features in reflectance difference data of silicon. Applied Surface Science. 2001;175-176:769-776. doi:10.1016/s0169-4332(01)00114-3
Hingerl, K., Balderas-Navarro, R. ., Bonanni, A., Tichopadek, P., & Schmidt, W. G. (2001). On the origin of resonance features in reflectance difference data of silicon. Applied Surface Science, 175–176, 769–776. https://doi.org/10.1016/s0169-4332(01)00114-3
@article{Hingerl_Balderas-Navarro_Bonanni_Tichopadek_Schmidt_2001, title={On the origin of resonance features in reflectance difference data of silicon}, volume={175–176}, DOI={10.1016/s0169-4332(01)00114-3}, journal={Applied Surface Science}, author={Hingerl, K and Balderas-Navarro, R.E and Bonanni, A and Tichopadek, P and Schmidt, Wolf Gero}, year={2001}, pages={769–776} }
Hingerl, K, R.E Balderas-Navarro, A Bonanni, P Tichopadek, and Wolf Gero Schmidt. “On the Origin of Resonance Features in Reflectance Difference Data of Silicon.” Applied Surface Science 175–176 (2001): 769–76. https://doi.org/10.1016/s0169-4332(01)00114-3.
K. Hingerl, R. . Balderas-Navarro, A. Bonanni, P. Tichopadek, and W. G. Schmidt, “On the origin of resonance features in reflectance difference data of silicon,” Applied Surface Science, vol. 175–176, pp. 769–776, 2001.
Hingerl, K., et al. “On the Origin of Resonance Features in Reflectance Difference Data of Silicon.” Applied Surface Science, vol. 175–176, 2001, pp. 769–76, doi:10.1016/s0169-4332(01)00114-3.
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