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9764 Publications
2023 | Conference Paper | LibreCat-ID: 52530
Prager RP, Trautmann H. Investigating the Viability of Existing Exploratory Landscape Analysis Features for Mixed-Integer Problems. In: Silva S, Paquete L, eds. Companion Proceedings of the Conference on Genetic and Evolutionary Computation, GECCO 2023, Companion Volume, Lisbon, Portugal, July 15-19, 2023. ACM; 2023:451–454. doi:10.1145/3583133.3590757
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| DOI
2023 | Conference Paper | LibreCat-ID: 48898
Seiler MV, Rook J, Heins J, Preuß OL, Bossek J, Trautmann H. Using Reinforcement Learning for Per-Instance Algorithm Configuration on the TSP. In: 2023 IEEE Symposium Series on Computational Intelligence (SSCI). ; :361-368. doi:10.1109/SSCI52147.2023.10372008
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2023 | Book Chapter | LibreCat-ID: 52662
Nachtigall M, Schlichtig M, Bodden E. Evaluation of Usability Criteria Addressed by Static Analysis Tools on a Large Scale. In: Software Engineering 2023. Gesellschaft für Informatik e.V.; 2023:95–96.
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2023 | Book Chapter | LibreCat-ID: 52660
Schlichtig M, Sassalla S, Narasimhan K, Bodden E. Introducing FUM: A Framework for API Usage Constraint and Misuse Classification. In: Software Engineering 2023. Gesellschaft für Informatik e.V.; 2023:105–106.
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2023 | Journal Article | LibreCat-ID: 34803
Celledoni E, Glöckner H, Riseth J, Schmeding A. Deep neural networks on diffeomorphism groups for optimal shape reparametrization. BIT Numerical Mathematics. 2023;63. doi:10.1007/s10543-023-00989-05
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| DOI
| arXiv
2023 | Journal Article | LibreCat-ID: 34793
Glöckner H, Hilgert J. Aspects of control theory on infinite-dimensional Lie groups and G-manifolds. Journal of Differential Equations. 2023;343:186–232. doi:10.1016/j.jde.2022.10.001
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| DOI
| arXiv
2023 | Journal Article | LibreCat-ID: 46264
Sadeghi-Kohan S, Hellebrand S, Wunderlich H-J. Workload-Aware Periodic Interconnect BIST. IEEE Design &Test. Published online 2023:1-1. doi:10.1109/mdat.2023.3298849
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2023 | Conference Paper | LibreCat-ID: 45830
Jafarzadeh H, Klemme F, Reimer JD, et al. Robust Pattern Generation for Small Delay Faults under Process Variations. In: IEEE International Test Conference (ITC’23), Anaheim, USA, October 2023. IEEE; 2023.
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