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1 Publication
2018 | Conference Paper | LibreCat-ID: 10575
Extending Aging Monitors for Early Life and Wear-Out Failure Prevention
C. Liu, E. Schneider, M. Kampmann, S. Hellebrand, H.-J. Wunderlich, in: 27th IEEE Asian Test Symposium (ATS’18), 2018.
LibreCat
| DOI
C. Liu, E. Schneider, M. Kampmann, S. Hellebrand, H.-J. Wunderlich, in: 27th IEEE Asian Test Symposium (ATS’18), 2018.