Extending Aging Monitors for Early Life and Wear-Out Failure Prevention
C. Liu, E. Schneider, M. Kampmann, S. Hellebrand, H.-J. Wunderlich, in: 27th IEEE Asian Test Symposium (ATS’18), 2018.
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| English
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Liu, Chang;
Schneider, Eric;
Kampmann, MatthiasLibreCat;
Hellebrand, SybilleLibreCat 
;
Wunderlich, Hans-Joachim
;
Wunderlich, Hans-JoachimDepartment
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27th IEEE Asian Test Symposium (ATS'18)
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Liu C, Schneider E, Kampmann M, Hellebrand S, Wunderlich H-J. Extending Aging Monitors for Early Life and Wear-Out Failure Prevention. In: 27th IEEE Asian Test Symposium (ATS’18). ; 2018. doi:10.1109/ats.2018.00028
Liu, C., Schneider, E., Kampmann, M., Hellebrand, S., & Wunderlich, H.-J. (2018). Extending Aging Monitors for Early Life and Wear-Out Failure Prevention. 27th IEEE Asian Test Symposium (ATS’18). https://doi.org/10.1109/ats.2018.00028
@inproceedings{Liu_Schneider_Kampmann_Hellebrand_Wunderlich_2018, title={Extending Aging Monitors for Early Life and Wear-Out Failure Prevention}, DOI={10.1109/ats.2018.00028}, booktitle={27th IEEE Asian Test Symposium (ATS’18)}, author={Liu, Chang and Schneider, Eric and Kampmann, Matthias and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2018} }
Liu, Chang, Eric Schneider, Matthias Kampmann, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Extending Aging Monitors for Early Life and Wear-Out Failure Prevention.” In 27th IEEE Asian Test Symposium (ATS’18), 2018. https://doi.org/10.1109/ats.2018.00028.
C. Liu, E. Schneider, M. Kampmann, S. Hellebrand, and H.-J. Wunderlich, “Extending Aging Monitors for Early Life and Wear-Out Failure Prevention,” 2018, doi: 10.1109/ats.2018.00028.
Liu, Chang, et al. “Extending Aging Monitors for Early Life and Wear-Out Failure Prevention.” 27th IEEE Asian Test Symposium (ATS’18), 2018, doi:10.1109/ats.2018.00028.
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