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1 Publication
2018 | Conference Paper | LibreCat-ID: 10575
Liu, C., Schneider, E., Kampmann, M., Hellebrand, S., & Wunderlich, H.-J. (2018). Extending Aging Monitors for Early Life and Wear-Out Failure Prevention. 27th IEEE Asian Test Symposium (ATS’18). https://doi.org/10.1109/ats.2018.00028
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