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1 Publication
2007 | Journal Article | LibreCat-ID: 29679
Schmalhorst, J., Ebke, D., Sacher, M., Liu, N.-N., Thomas, A., Reiss, G., Htten, A., & Arenholz, E. (2007). Chemical and Magnetic Interface Properties of Tunnel Junctions With Co$_2$MnSi/Co$_2$FeSi Multilayer Electrode Showing Large Tunneling Magnetoresistance. IEEE Transactions on Magnetics, 43(6), 2806–2808. https://doi.org/10.1109/tmag.2007.893475
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