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234 Publications
2004 | Journal Article | LibreCat-ID: 29924
Amann N, Böcker J, Prenner F. Active Damping of Drive Train Oscillations for an Electrically Driven Vehicle. IEEE/ASME Transactions on Mechatronics. 2004;9(4):697-700. doi:10.1109/tmech.2004.839036
LibreCat
| DOI
2004 | Conference Paper | LibreCat-ID: 39061
Krupp A, Müller W, Oliver I. Formal Refinement and Model Checking of An Echo Cancellation Unit. In: Proceedings of DATE’04 Designers’ Forum. ; 2004. doi:10.1109/DATE.2004.1269214
LibreCat
| DOI
2004 | Journal Article | LibreCat-ID: 42018
Kramer T, Scholz S, Maskos M, Huber K. Colloid–polymer mixtures in solution with refractive index matched acrylate colloids. Journal of Colloid and Interface Science. 2004;279(2):447-457. doi:10.1016/j.jcis.2004.06.102
LibreCat
| DOI
2004 | Journal Article | LibreCat-ID: 29696
Schmalhorst J, Sacher M, Höink V, Reiss G, Engel D, Ehresmann A. X-ray absorption and magnetic circular dichroism studies of ion-bombarded ferromagnet-antiferromagnet bilayers. Physical Review B. 2004;70(18). doi:10.1103/physrevb.70.184403
LibreCat
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2004 | Journal Article | LibreCat-ID: 29693
Schmalhorst J, Sacher M, Höink V, Reiss G, Engel D, Ehresmann A. X-ray absorption and magnetic circular dichroism studies of ion-bombarded ferromagnet-antiferromagnet bilayers. Physical Review B. 2004;70(18). doi:10.1103/physrevb.70.184403
LibreCat
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2004 | Journal Article | LibreCat-ID: 29690
Engel D, Ehresmann A, Schmalhorst J, Sacher M, Höink V, Reiss G. Initialization of unidirectional anisotropy in a ferromagnet–antiferromagnet bilayer by keV-He ion bombardment. Journal of Magnetism and Magnetic Materials. 2004;293(3):849-853. doi:10.1016/j.jmmm.2004.12.003
LibreCat
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2004 | Journal Article | LibreCat-ID: 29695
Schmalhorst J, Kämmerer S, Sacher M, Reiss G, Hütten A, Scholl A. Interface structure and magnetism of magnetic tunnel junctions with aCo2MnSielectrode. Physical Review B. 2004;70(2). doi:10.1103/physrevb.70.024426
LibreCat
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2003 | Journal Article | LibreCat-ID: 39985
Röder T, Kitzerow H-S, Hummelen JC. Morphology and fluorescence quenching in photovoltaic samples containing fullerene and poly(p-phenylene-vinylene) derivatives. Synthetic Metals. 2003;141(3):271-275. doi:10.1016/s0379-6779(03)00412-0
LibreCat
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2003 | Journal Article | LibreCat-ID: 39851
Pannemann Ch, Diekmann T, Hilleringmann U. Nanometer scale organic thin film transistors with Pentacene. Microelectronic Engineering. 2003;67-68:845-852. doi:10.1016/s0167-9317(03)00146-1
LibreCat
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2002 | Journal Article | LibreCat-ID: 29998
Böcker J, Janning J, Jebenstreit H. High dynamic control of a three-level voltage-source-converter drive for a main strip mill. IEEE Transactions on Industrial Electronics. 2002;49(5):1081-1092. doi:10.1109/tie.2002.803220
LibreCat
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2002 | Journal Article | LibreCat-ID: 39904
Hilleringmann U, Goser K. Optoelectronic system integration on silicon: waveguides, photodetectors, and VLSI CMOS circuits on one chip. IEEE Transactions on Electron Devices. 2002;42(5):841-846. doi:10.1109/16.381978
LibreCat
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2002 | Journal Article | LibreCat-ID: 39912
Schönstein I, Müller J, Hilleringmann U, Goser K. Characterization of submicron NMOS devices due to visible light emission. Microelectronic Engineering. 2002;21(1-4):363-366. doi:10.1016/0167-9317(93)90092-j
LibreCat
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2002 | Journal Article | LibreCat-ID: 39914
Hilleringmann U, Goser K. Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon. Microelectronic Engineering. 2002;19(1-4):211-214. doi:10.1016/0167-9317(92)90425-q
LibreCat
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2002 | Journal Article | LibreCat-ID: 39906
Brass E, Hilleringmann U, Schumacher K. System integration of optical devices and analog CMOS amplifiers. IEEE Journal of Solid-State Circuits. 2002;29(8):1006-1010. doi:10.1109/4.297714
LibreCat
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2002 | Journal Article | LibreCat-ID: 39907
Brass E, Hilleringmann U, Schumacher K. System integration of optical devices and analog CMOS amplifiers. IEEE Journal of Solid-State Circuits. 2002;29(8):1006-1010. doi:10.1109/4.297714
LibreCat
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2002 | Journal Article | LibreCat-ID: 39899
Horstmann JT, Hilleringmann U, Goser K. Characterisation of sub-100 nm-MOS-transistors processed by optical lithography and a sidewall-etchback technique. Microelectronic Engineering. 2002;30(1-4):431-434. doi:10.1016/0167-9317(95)00280-4
LibreCat
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2002 | Journal Article | LibreCat-ID: 39925
Goser K, Hilleringmann U, Rueckert U, Schumacher K. VLSI technologies for artificial neural networks. IEEE Micro. 2002;9(6):28-44. doi:10.1109/40.42985
LibreCat
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2002 | Journal Article | LibreCat-ID: 39882
Mankowski V, Hilleringmann U, Schumacher K. A novel insulation technique for smart power switching devices and very high voltage ICs above 10 kV. Microelectronic Engineering. 2002;53(1-4):525-528. doi:10.1016/s0167-9317(00)00370-1
LibreCat
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2002 | Journal Article | LibreCat-ID: 39879
Horstmann JT, Hilleringmann U, Goser K. 1/f-Noise of sub-100 nm-MOS-transistors fabricated by a special deposition and etchback technique. Microelectronic Engineering. 2002;53(1-4):213-216. doi:10.1016/s0167-9317(00)00299-9
LibreCat
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2002 | Journal Article | LibreCat-ID: 39919
Hilleringmann U, Knospe K, Heite C, Schumacher K, Goser K. A silicon based technology for monolithic integration of waveguides and VLSI CMOS circuits. Microelectronic Engineering. 2002;15(1-4):289-292. doi:10.1016/0167-9317(91)90231-2
LibreCat
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