Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits

B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, H.-J. Wunderlich, in: 4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper), Chicago, IL, USA, 2010.

Download
No fulltext has been uploaded.
Conference Paper | English
Author
Becker, Bernd; Hellebrand, SybilleLibreCat ; Polian, Ilia; Straube, Bernd; Vermeiren, Wolfgang; Wunderlich, Hans-Joachim
Publishing Year
Proceedings Title
4th Workshop on Dependable and Secure Nanocomputing (WDSN'10), (Invited Paper)
LibreCat-ID

Cite this

Becker B, Hellebrand S, Polian I, Straube B, Vermeiren W, Wunderlich H-J. Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits. In: 4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper). ; 2010.
Becker, B., Hellebrand, S., Polian, I., Straube, B., Vermeiren, W., & Wunderlich, H.-J. (2010). Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits. 4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper).
@inproceedings{Becker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2010, place={Chicago, IL, USA}, title={Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits}, booktitle={4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper)}, author={Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim}, year={2010} }
Becker, Bernd, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.” In 4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper). Chicago, IL, USA, 2010.
B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, and H.-J. Wunderlich, “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits,” 2010.
Becker, Bernd, et al. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.” 4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper), 2010.

Export

Marked Publications

Open Data LibreCat

Search this title in

Google Scholar