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8 Publications
2024 | Misc | LibreCat-ID: 50284
Modeling Crosstalk-induced Interconnect Delay with Polynomial Regression
A. Stiballe, J.D. Reimer, S. Sadeghi-Kohan, S. Hellebrand, Modeling Crosstalk-Induced Interconnect Delay with Polynomial Regression, 37. ITG / GMM / GI -Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’24), Feb. 2024, Darmstadt, Germany, 2024.
LibreCat
A. Stiballe, J.D. Reimer, S. Sadeghi-Kohan, S. Hellebrand, Modeling Crosstalk-Induced Interconnect Delay with Polynomial Regression, 37. ITG / GMM / GI -Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’24), Feb. 2024, Darmstadt, Germany, 2024.
2024 | Conference Paper | LibreCat-ID: 56014
Minimizing PVT-Variability by Exploiting the Zero Temperature Coefficient (ZTC) for Robust Delay Fault Testing
H. Jafarzadeh, F. Klemme, J.D. Reimer, H. Amrouch, S. Hellebrand, H.-J. Wunderlich, in: To Appear in: IEEE International Test Conference (ITC’24), San Diego, CA, USA, November 2024, IEEE, San Diego, CA, 2024.
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H. Jafarzadeh, F. Klemme, J.D. Reimer, H. Amrouch, S. Hellebrand, H.-J. Wunderlich, in: To Appear in: IEEE International Test Conference (ITC’24), San Diego, CA, USA, November 2024, IEEE, San Diego, CA, 2024.
2023 | Conference Paper | LibreCat-ID: 46738
Optimizing the Streaming of Sensor Data with Approximate Communication
S. Sadeghi-Kohan, J.D. Reimer, S. Hellebrand, H.-J. Wunderlich, in: IEEE Asian Test Symposium (ATS’23), October 2023, Beijing, China, 2023.
LibreCat
S. Sadeghi-Kohan, J.D. Reimer, S. Hellebrand, H.-J. Wunderlich, in: IEEE Asian Test Symposium (ATS’23), October 2023, Beijing, China, 2023.
2023 | Conference Paper | LibreCat-ID: 45830
Robust Pattern Generation for Small Delay Faults under Process Variations
H. Jafarzadeh, F. Klemme, J.D. Reimer, Z.P. Najafi Haghi, H. Amrouch, S. Hellebrand, H.-J. Wunderlich, in: IEEE International Test Conference (ITC’23), Anaheim, USA, October 2023, IEEE, Anaheim, CA, USA, 2023.
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H. Jafarzadeh, F. Klemme, J.D. Reimer, Z.P. Najafi Haghi, H. Amrouch, S. Hellebrand, H.-J. Wunderlich, in: IEEE International Test Conference (ITC’23), Anaheim, USA, October 2023, IEEE, Anaheim, CA, USA, 2023.
2023 | Misc | LibreCat-ID: 35204
On Cryptography Effects on Interconnect Reliability
A. Ghazal, S. Sadeghi-Kohan, J.D. Reimer, S. Hellebrand, On Cryptography Effects on Interconnect Reliability, 35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023, Erfurt, Germany, 2023.
LibreCat
A. Ghazal, S. Sadeghi-Kohan, J.D. Reimer, S. Hellebrand, On Cryptography Effects on Interconnect Reliability, 35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023, Erfurt, Germany, 2023.
2023 | Conference Paper | LibreCat-ID: 41875
Approximate Computing: Balancing Performance, Power, Reliability, and Safety
A. Badran, S. Sadeghi-Kohan, J.D. Reimer, S. Hellebrand, in: 28th IEEE European Test Symposium (ETS’23), May 2023, Venice, Italy, 2023.
LibreCat
A. Badran, S. Sadeghi-Kohan, J.D. Reimer, S. Hellebrand, in: 28th IEEE European Test Symposium (ETS’23), May 2023, Venice, Italy, 2023.
2020 | Conference Paper | LibreCat-ID: 19422
Variation-Aware Test for Logic Interconnects using Neural Networks - A Case Study
A. Sprenger, S. Sadeghi-Kohan, J.D. Reimer, S. Hellebrand, in: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20), October 2020, Virtual Conference - Originally Frascati (Rome), Italy, 2020.
LibreCat
A. Sprenger, S. Sadeghi-Kohan, J.D. Reimer, S. Hellebrand, in: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20), October 2020, Virtual Conference - Originally Frascati (Rome), Italy, 2020.
2020 | Conference Paper | LibreCat-ID: 19421
Logic Fault Diagnosis of Hidden Delay Defects
S. Holst, M. Kampmann, A. Sprenger, J.D. Reimer, S. Hellebrand, H.-J. Wunderlich, X. Weng, in: IEEE International Test Conference (ITC’20), November 2020, Virtual Conference - Originally Washington, DC, USA, 2020.
LibreCat
S. Holst, M. Kampmann, A. Sprenger, J.D. Reimer, S. Hellebrand, H.-J. Wunderlich, X. Weng, in: IEEE International Test Conference (ITC’20), November 2020, Virtual Conference - Originally Washington, DC, USA, 2020.