Minimizing PVT-Variability by Exploiting the Zero Temperature Coefficient (ZTC) for Robust Delay Fault Testing

Jafarzadeh, H., Klemme, F., Reimer, J. D., Amrouch, H., Hellebrand, S., & Wunderlich, H.-J. (2024). Minimizing PVT-Variability by Exploiting the Zero Temperature Coefficient (ZTC) for Robust Delay Fault Testing. To Appear in: IEEE International Test Conference (ITC’24), San Diego, CA, USA, November 2024. IEEE International Test Conference (ITC’24), San Diego, CA, USA.

@inproceedings{Jafarzadeh_Klemme_Reimer_ Amrouch_Hellebrand_Wunderlich_2024, place={San Diego, CA}, title={Minimizing PVT-Variability by Exploiting the Zero Temperature Coefficient (ZTC) for Robust Delay Fault Testing}, booktitle={To appear in: IEEE International Test Conference (ITC’24), San Diego, CA, USA, November 2024}, publisher={IEEE}, author={Jafarzadeh, Hanieh and Klemme, Florian and Reimer, Jan Dennis and Amrouch, Hussam and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2024} }

Jafarzadeh, Hanieh, Florian Klemme, Jan Dennis Reimer, Hussam Amrouch, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Minimizing PVT-Variability by Exploiting the Zero Temperature Coefficient (ZTC) for Robust Delay Fault Testing.” In To Appear in: IEEE International Test Conference (ITC’24), San Diego, CA, USA, November 2024. San Diego, CA: IEEE, 2024.

H. Jafarzadeh, F. Klemme, J. D. Reimer, H. Amrouch, S. Hellebrand, and H.-J. Wunderlich, “Minimizing PVT-Variability by Exploiting the Zero Temperature Coefficient (ZTC) for Robust Delay Fault Testing,” presented at the IEEE International Test Conference (ITC’24), San Diego, CA, USA, 2024.

Jafarzadeh, Hanieh, et al. “Minimizing PVT-Variability by Exploiting the Zero Temperature Coefficient (ZTC) for Robust Delay Fault Testing.” To Appear in: IEEE International Test Conference (ITC’24), San Diego, CA, USA, November 2024, IEEE, 2024.