Special Session on Early Life Failures

J. Deshmukh, W. Kunz, H.-J. Wunderlich, S. Hellebrand, in: 35th IEEE VLSI Test Symposium (VTS’17), IEEE, Caesars Palace, Las Vegas, Nevada, USA, 2017.

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35th IEEE VLSI Test Symposium (VTS'17)
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Deshmukh J, Kunz W, Wunderlich H-J, Hellebrand S. Special Session on Early Life Failures. In: 35th IEEE VLSI Test Symposium (VTS’17). Caesars Palace, Las Vegas, Nevada, USA: IEEE; 2017. doi:10.1109/vts.2017.7928933
Deshmukh, J., Kunz, W., Wunderlich, H.-J., & Hellebrand, S. (2017). Special Session on Early Life Failures. In 35th IEEE VLSI Test Symposium (VTS’17). Caesars Palace, Las Vegas, Nevada, USA: IEEE. https://doi.org/10.1109/vts.2017.7928933
@inproceedings{Deshmukh_Kunz_Wunderlich_Hellebrand_2017, place={Caesars Palace, Las Vegas, Nevada, USA}, title={Special Session on Early Life Failures}, DOI={10.1109/vts.2017.7928933}, booktitle={35th IEEE VLSI Test Symposium (VTS’17)}, publisher={IEEE}, author={Deshmukh, Jyotirmoy and Kunz, Wolfgang and Wunderlich, Hans-Joachim and Hellebrand, Sybille}, year={2017} }
Deshmukh, Jyotirmoy, Wolfgang Kunz, Hans-Joachim Wunderlich, and Sybille Hellebrand. “Special Session on Early Life Failures.” In 35th IEEE VLSI Test Symposium (VTS’17). Caesars Palace, Las Vegas, Nevada, USA: IEEE, 2017. https://doi.org/10.1109/vts.2017.7928933.
J. Deshmukh, W. Kunz, H.-J. Wunderlich, and S. Hellebrand, “Special Session on Early Life Failures,” in 35th IEEE VLSI Test Symposium (VTS’17), 2017.
Deshmukh, Jyotirmoy, et al. “Special Session on Early Life Failures.” 35th IEEE VLSI Test Symposium (VTS’17), IEEE, 2017, doi:10.1109/vts.2017.7928933.

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