Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test
A. Cook, S. Hellebrand, M. E. Imhof, A. Mumtaz, H.-J. Wunderlich, in: 13th IEEE Latin American Test Workshop (LATW’12), IEEE, Quito, Ecuador, 2012, pp. 1–4.
Download
No fulltext has been uploaded.
Conference Paper
| English
Author
Cook, Alejandro;
Hellebrand, SybilleLibreCat 
;
E. Imhof, Michael;
Mumtaz, Abdullah;
Wunderlich, Hans-Joachim
;
E. Imhof, Michael;
Mumtaz, Abdullah;
Wunderlich, Hans-JoachimDepartment
Publishing Year
Proceedings Title
13th IEEE Latin American Test Workshop (LATW'12)
Page
1-4
LibreCat-ID
Cite this
Cook A, Hellebrand S, E. Imhof M, Mumtaz A, Wunderlich H-J. Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test. In: 13th IEEE Latin American Test Workshop (LATW’12). Quito, Ecuador: IEEE; 2012:1-4. doi:10.1109/latw.2012.6261229
Cook, A., Hellebrand, S., E. Imhof, M., Mumtaz, A., & Wunderlich, H.-J. (2012). Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test. In 13th IEEE Latin American Test Workshop (LATW’12) (pp. 1–4). Quito, Ecuador: IEEE. https://doi.org/10.1109/latw.2012.6261229
@inproceedings{Cook_Hellebrand_E. Imhof_Mumtaz_Wunderlich_2012, place={Quito, Ecuador}, title={Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test}, DOI={10.1109/latw.2012.6261229}, booktitle={13th IEEE Latin American Test Workshop (LATW’12)}, publisher={IEEE}, author={Cook, Alejandro and Hellebrand, Sybille and E. Imhof, Michael and Mumtaz, Abdullah and Wunderlich, Hans-Joachim}, year={2012}, pages={1–4} }
Cook, Alejandro, Sybille Hellebrand, Michael E. Imhof, Abdullah Mumtaz, and Hans-Joachim Wunderlich. “Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test.” In 13th IEEE Latin American Test Workshop (LATW’12), 1–4. Quito, Ecuador: IEEE, 2012. https://doi.org/10.1109/latw.2012.6261229.
A. Cook, S. Hellebrand, M. E. Imhof, A. Mumtaz, and H.-J. Wunderlich, “Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test,” in 13th IEEE Latin American Test Workshop (LATW’12), 2012, pp. 1–4.
Cook, Alejandro, et al. “Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test.” 13th IEEE Latin American Test Workshop (LATW’12), IEEE, 2012, pp. 1–4, doi:10.1109/latw.2012.6261229.
Google Scholar