Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test

A. Cook, S. Hellebrand, M. E. Imhof, A. Mumtaz, H.-J. Wunderlich, in: {13th IEEE Latin American Test Workshop (LATW’12)}, {IEEE}, Quito, Ecuador, 2012, pp. 1–4.

Download
No fulltext has been uploaded.
Conference Paper | English
Author
; ; ; ;
Publishing Year
Proceedings Title
{13th IEEE Latin American Test Workshop (LATW'12)}
Page
1-4
LibreCat-ID

Cite this

Cook A, Hellebrand S, E. Imhof M, Mumtaz A, Wunderlich H-J. Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test. In: {13th IEEE Latin American Test Workshop (LATW’12)}. Quito, Ecuador: {IEEE}; 2012:1-4. doi:10.1109/latw.2012.6261229
Cook, A., Hellebrand, S., E. Imhof, M., Mumtaz, A., & Wunderlich, H.-J. (2012). Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test. In {13th IEEE Latin American Test Workshop (LATW’12)} (pp. 1–4). Quito, Ecuador: {IEEE}. https://doi.org/10.1109/latw.2012.6261229
@inproceedings{Cook_Hellebrand_E. Imhof_Mumtaz_Wunderlich_2012, place={Quito, Ecuador}, title={Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test}, DOI={10.1109/latw.2012.6261229}, booktitle={{13th IEEE Latin American Test Workshop (LATW’12)}}, publisher={{IEEE}}, author={Cook, Alejandro and Hellebrand, Sybille and E. Imhof, Michael and Mumtaz, Abdullah and Wunderlich, Hans-Joachim}, year={2012}, pages={1–4} }
Cook, Alejandro, Sybille Hellebrand, Michael E. Imhof, Abdullah Mumtaz, and Hans-Joachim Wunderlich. “Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test.” In {13th IEEE Latin American Test Workshop (LATW’12)}, 1–4. Quito, Ecuador: {IEEE}, 2012. https://doi.org/10.1109/latw.2012.6261229.
A. Cook, S. Hellebrand, M. E. Imhof, A. Mumtaz, and H.-J. Wunderlich, “Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test,” in {13th IEEE Latin American Test Workshop (LATW’12)}, 2012, pp. 1–4.
Cook, Alejandro, et al. “Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test.” {13th IEEE Latin American Test Workshop (LATW’12)}, {IEEE}, 2012, pp. 1–4, doi:10.1109/latw.2012.6261229.

Export

Marked Publications

Open Data LibreCat

Search this title in

Google Scholar