Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test

A. Cook, S. Hellebrand, H.-J. Wunderlich, in: {17th IEEE European Test Symposium (ETS’12)}, {IEEE}, Annecy, France, 2012, pp. 1–6.

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{17th IEEE European Test Symposium (ETS'12)}
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Cook A, Hellebrand S, Wunderlich H-J. Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test. In: {17th IEEE European Test Symposium (ETS’12)}. Annecy, France: {IEEE}; 2012:1-6. doi:10.1109/ets.2012.6233025
Cook, A., Hellebrand, S., & Wunderlich, H.-J. (2012). Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test. In {17th IEEE European Test Symposium (ETS’12)} (pp. 1–6). Annecy, France: {IEEE}. https://doi.org/10.1109/ets.2012.6233025
@inproceedings{Cook_Hellebrand_Wunderlich_2012, place={Annecy, France}, title={Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test}, DOI={10.1109/ets.2012.6233025}, booktitle={{17th IEEE European Test Symposium (ETS’12)}}, publisher={{IEEE}}, author={Cook, Alejandro and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2012}, pages={1–6} }
Cook, Alejandro, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test.” In {17th IEEE European Test Symposium (ETS’12)}, 1–6. Annecy, France: {IEEE}, 2012. https://doi.org/10.1109/ets.2012.6233025.
A. Cook, S. Hellebrand, and H.-J. Wunderlich, “Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test,” in {17th IEEE European Test Symposium (ETS’12)}, 2012, pp. 1–6.
Cook, Alejandro, et al. “Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test.” {17th IEEE European Test Symposium (ETS’12)}, {IEEE}, 2012, pp. 1–6, doi:10.1109/ets.2012.6233025.

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