Variation-Aware Fault Modeling

F. Hopsch, B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, H.-J. Wunderlich, in: {19th IEEE Asian Test Symposium (ATS’10)}, {IEEE}, Shanghai, China, 2010, pp. 87–93.

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{19th IEEE Asian Test Symposium (ATS'10)}

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Hopsch F, Becker B, Hellebrand S, et al. Variation-Aware Fault Modeling. In: {19th IEEE Asian Test Symposium (ATS’10)}. Shanghai, China: {IEEE}; 2010:87-93. doi:10.1109/ats.2010.24
Hopsch, F., Becker, B., Hellebrand, S., Polian, I., Straube, B., Vermeiren, W., & Wunderlich, H.-J. (2010). Variation-Aware Fault Modeling. In {19th IEEE Asian Test Symposium (ATS’10)} (pp. 87–93). Shanghai, China: {IEEE}.
@inproceedings{Hopsch_Becker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2010, place={Shanghai, China}, title={Variation-Aware Fault Modeling}, DOI={10.1109/ats.2010.24}, booktitle={{19th IEEE Asian Test Symposium (ATS’10)}}, publisher={{IEEE}}, author={Hopsch, Fabian and Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim}, year={2010}, pages={87–93} }
Hopsch, Fabian, Bernd Becker, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Variation-Aware Fault Modeling.” In {19th IEEE Asian Test Symposium (ATS’10)}, 87–93. Shanghai, China: {IEEE}, 2010.
F. Hopsch et al., “Variation-Aware Fault Modeling,” in {19th IEEE Asian Test Symposium (ATS’10)}, 2010, pp. 87–93.
Hopsch, Fabian, et al. “Variation-Aware Fault Modeling.” {19th IEEE Asian Test Symposium (ATS’10)}, {IEEE}, 2010, pp. 87–93, doi:10.1109/ats.2010.24.


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