Variation-Aware Fault Modeling

F. Hopsch, B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, H.-J. Wunderlich, in: 19th IEEE Asian Test Symposium (ATS’10), IEEE, Shanghai, China, 2010, pp. 87–93.

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Conference Paper | English
Hopsch, Fabian; Becker, Bernd; Hellebrand, SybilleLibreCat ; Polian, Ilia; Straube, Bernd; Vermeiren, Wolfgang; Wunderlich, Hans-Joachim
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19th IEEE Asian Test Symposium (ATS'10)

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Hopsch F, Becker B, Hellebrand S, et al. Variation-Aware Fault Modeling. In: 19th IEEE Asian Test Symposium (ATS’10). IEEE; 2010:87-93. doi:10.1109/ats.2010.24
Hopsch, F., Becker, B., Hellebrand, S., Polian, I., Straube, B., Vermeiren, W., & Wunderlich, H.-J. (2010). Variation-Aware Fault Modeling. 19th IEEE Asian Test Symposium (ATS’10), 87–93.
@inproceedings{Hopsch_Becker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2010, place={Shanghai, China}, title={Variation-Aware Fault Modeling}, DOI={10.1109/ats.2010.24}, booktitle={19th IEEE Asian Test Symposium (ATS’10)}, publisher={IEEE}, author={Hopsch, Fabian and Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim}, year={2010}, pages={87–93} }
Hopsch, Fabian, Bernd Becker, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Variation-Aware Fault Modeling.” In 19th IEEE Asian Test Symposium (ATS’10), 87–93. Shanghai, China: IEEE, 2010.
F. Hopsch et al., “Variation-Aware Fault Modeling,” in 19th IEEE Asian Test Symposium (ATS’10), 2010, pp. 87–93, doi: 10.1109/ats.2010.24.
Hopsch, Fabian, et al. “Variation-Aware Fault Modeling.” 19th IEEE Asian Test Symposium (ATS’10), IEEE, 2010, pp. 87–93, doi:10.1109/ats.2010.24.


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