Efficient Test Response Compaction for Robust BIST Using Parity Sequences
T. Indlekofer, M. Schnittger, S. Hellebrand, in: 28th IEEE International Conference on Computer Design (ICCD’10), IEEE, Amsterdam, The Netherlands, 2010, pp. 480–485.
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Indlekofer, Thomas;
Schnittger, Michael;
Hellebrand, SybilleLibreCat 
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28th IEEE International Conference on Computer Design (ICCD'10)
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480-485
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Indlekofer T, Schnittger M, Hellebrand S. Efficient Test Response Compaction for Robust BIST Using Parity Sequences. In: 28th IEEE International Conference on Computer Design (ICCD’10). IEEE; 2010:480-485. doi:10.1109/iccd.2010.5647648
Indlekofer, T., Schnittger, M., & Hellebrand, S. (2010). Efficient Test Response Compaction for Robust BIST Using Parity Sequences. 28th IEEE International Conference on Computer Design (ICCD’10), 480–485. https://doi.org/10.1109/iccd.2010.5647648
@inproceedings{Indlekofer_Schnittger_Hellebrand_2010, place={Amsterdam, The Netherlands}, title={Efficient Test Response Compaction for Robust BIST Using Parity Sequences}, DOI={10.1109/iccd.2010.5647648}, booktitle={28th IEEE International Conference on Computer Design (ICCD’10)}, publisher={IEEE}, author={Indlekofer, Thomas and Schnittger, Michael and Hellebrand, Sybille}, year={2010}, pages={480–485} }
Indlekofer, Thomas, Michael Schnittger, and Sybille Hellebrand. “Efficient Test Response Compaction for Robust BIST Using Parity Sequences.” In 28th IEEE International Conference on Computer Design (ICCD’10), 480–85. Amsterdam, The Netherlands: IEEE, 2010. https://doi.org/10.1109/iccd.2010.5647648.
T. Indlekofer, M. Schnittger, and S. Hellebrand, “Efficient Test Response Compaction for Robust BIST Using Parity Sequences,” in 28th IEEE International Conference on Computer Design (ICCD’10), 2010, pp. 480–485, doi: 10.1109/iccd.2010.5647648.
Indlekofer, Thomas, et al. “Efficient Test Response Compaction for Robust BIST Using Parity Sequences.” 28th IEEE International Conference on Computer Design (ICCD’10), IEEE, 2010, pp. 480–85, doi:10.1109/iccd.2010.5647648.
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