Efficient Test Response Compaction for Robust BIST Using Parity Sequences

T. Indlekofer, M. Schnittger, S. Hellebrand, in: {28th IEEE International Conference on Computer Design (ICCD’10)}, {IEEE}, Amsterdam, The Netherlands, 2010, pp. 480–485.

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{28th IEEE International Conference on Computer Design (ICCD'10)}
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480-485
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Indlekofer T, Schnittger M, Hellebrand S. Efficient Test Response Compaction for Robust BIST Using Parity Sequences. In: {28th IEEE International Conference on Computer Design (ICCD’10)}. Amsterdam, The Netherlands: {IEEE}; 2010:480-485. doi:10.1109/iccd.2010.5647648
Indlekofer, T., Schnittger, M., & Hellebrand, S. (2010). Efficient Test Response Compaction for Robust BIST Using Parity Sequences. In {28th IEEE International Conference on Computer Design (ICCD’10)} (pp. 480–485). Amsterdam, The Netherlands: {IEEE}. https://doi.org/10.1109/iccd.2010.5647648
@inproceedings{Indlekofer_Schnittger_Hellebrand_2010, place={Amsterdam, The Netherlands}, title={Efficient Test Response Compaction for Robust BIST Using Parity Sequences}, DOI={10.1109/iccd.2010.5647648}, booktitle={{28th IEEE International Conference on Computer Design (ICCD’10)}}, publisher={{IEEE}}, author={Indlekofer, Thomas and Schnittger, Michael and Hellebrand, Sybille}, year={2010}, pages={480–485} }
Indlekofer, Thomas, Michael Schnittger, and Sybille Hellebrand. “Efficient Test Response Compaction for Robust BIST Using Parity Sequences.” In {28th IEEE International Conference on Computer Design (ICCD’10)}, 480–85. Amsterdam, The Netherlands: {IEEE}, 2010. https://doi.org/10.1109/iccd.2010.5647648.
T. Indlekofer, M. Schnittger, and S. Hellebrand, “Efficient Test Response Compaction for Robust BIST Using Parity Sequences,” in {28th IEEE International Conference on Computer Design (ICCD’10)}, 2010, pp. 480–485.
Indlekofer, Thomas, et al. “Efficient Test Response Compaction for Robust BIST Using Parity Sequences.” {28th IEEE International Conference on Computer Design (ICCD’10)}, {IEEE}, 2010, pp. 480–85, doi:10.1109/iccd.2010.5647648.

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