The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems
M. Hunger, S. Hellebrand, in: 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10), IEEE, Kyoto, Japan, 2010, pp. 101–108.
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Hunger, Marc;
Hellebrand, SybilleLibreCat 
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25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'10)
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101-108
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Hunger M, Hellebrand S. The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems. In: 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10). IEEE; 2010:101-108. doi:10.1109/dft.2010.19
Hunger, M., & Hellebrand, S. (2010). The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems. 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10), 101–108. https://doi.org/10.1109/dft.2010.19
@inproceedings{Hunger_Hellebrand_2010, place={Kyoto, Japan}, title={The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems}, DOI={10.1109/dft.2010.19}, booktitle={25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10)}, publisher={IEEE}, author={Hunger, Marc and Hellebrand, Sybille}, year={2010}, pages={101–108} }
Hunger, Marc, and Sybille Hellebrand. “The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems.” In 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10), 101–8. Kyoto, Japan: IEEE, 2010. https://doi.org/10.1109/dft.2010.19.
M. Hunger and S. Hellebrand, “The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems,” in 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10), 2010, pp. 101–108, doi: 10.1109/dft.2010.19.
Hunger, Marc, and Sybille Hellebrand. “The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems.” 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10), IEEE, 2010, pp. 101–08, doi:10.1109/dft.2010.19.
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