Reusing NoC-Infrastructure for Test Data Compression

V. Froese, R. Ibers, S. Hellebrand, in: {28th IEEE VLSI Test Symposium (VTS’10)}, {IEEE}, Santa Cruz, CA, USA, 2010, pp. 227–231.

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Conference Paper | English
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Proceedings Title
{28th IEEE VLSI Test Symposium (VTS'10)}
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227-231
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Froese V, Ibers R, Hellebrand S. Reusing NoC-Infrastructure for Test Data Compression. In: {28th IEEE VLSI Test Symposium (VTS’10)}. Santa Cruz, CA, USA: {IEEE}; 2010:227-231. doi:10.1109/vts.2010.5469570
Froese, V., Ibers, R., & Hellebrand, S. (2010). Reusing NoC-Infrastructure for Test Data Compression. In {28th IEEE VLSI Test Symposium (VTS’10)} (pp. 227–231). Santa Cruz, CA, USA: {IEEE}. https://doi.org/10.1109/vts.2010.5469570
@inproceedings{Froese_Ibers_Hellebrand_2010, place={Santa Cruz, CA, USA}, title={Reusing NoC-Infrastructure for Test Data Compression}, DOI={10.1109/vts.2010.5469570}, booktitle={{28th IEEE VLSI Test Symposium (VTS’10)}}, publisher={{IEEE}}, author={Froese, Viktor and Ibers, Rüdiger and Hellebrand, Sybille}, year={2010}, pages={227–231} }
Froese, Viktor, Rüdiger Ibers, and Sybille Hellebrand. “Reusing NoC-Infrastructure for Test Data Compression.” In {28th IEEE VLSI Test Symposium (VTS’10)}, 227–31. Santa Cruz, CA, USA: {IEEE}, 2010. https://doi.org/10.1109/vts.2010.5469570.
V. Froese, R. Ibers, and S. Hellebrand, “Reusing NoC-Infrastructure for Test Data Compression,” in {28th IEEE VLSI Test Symposium (VTS’10)}, 2010, pp. 227–231.
Froese, Viktor, et al. “Reusing NoC-Infrastructure for Test Data Compression.” {28th IEEE VLSI Test Symposium (VTS’10)}, {IEEE}, 2010, pp. 227–31, doi:10.1109/vts.2010.5469570.

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