A Modular Memory BIST for Optimized Memory Repair

P. Oehler, A. Bosio, G. di Natale, S. Hellebrand, in: {14th IEEE International On-Line Testing Symposium (IOLTS’08), (Poster)}, {IEEE}, Rhodos, Greece, 2008.

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{14th IEEE International On-Line Testing Symposium (IOLTS'08), (Poster)}
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Oehler P, Bosio A, di Natale G, Hellebrand S. A Modular Memory BIST for Optimized Memory Repair. In: {14th IEEE International On-Line Testing Symposium (IOLTS’08), (Poster)}. Rhodos, Greece: {IEEE}; 2008. doi:10.1109/iolts.2008.30
Oehler, P., Bosio, A., di Natale, G., & Hellebrand, S. (2008). A Modular Memory BIST for Optimized Memory Repair. In {14th IEEE International On-Line Testing Symposium (IOLTS’08), (Poster)}. Rhodos, Greece: {IEEE}. https://doi.org/10.1109/iolts.2008.30
@inproceedings{Oehler_Bosio_di Natale_Hellebrand_2008, place={Rhodos, Greece}, title={A Modular Memory BIST for Optimized Memory Repair}, DOI={10.1109/iolts.2008.30}, booktitle={{14th IEEE International On-Line Testing Symposium (IOLTS’08), (Poster)}}, publisher={{IEEE}}, author={Oehler, Philipp and Bosio, Alberto and di Natale, Giorgio and Hellebrand, Sybille}, year={2008} }
Oehler, Philipp, Alberto Bosio, Giorgio di Natale, and Sybille Hellebrand. “A Modular Memory BIST for Optimized Memory Repair.” In {14th IEEE International On-Line Testing Symposium (IOLTS’08), (Poster)}. Rhodos, Greece: {IEEE}, 2008. https://doi.org/10.1109/iolts.2008.30.
P. Oehler, A. Bosio, G. di Natale, and S. Hellebrand, “A Modular Memory BIST for Optimized Memory Repair,” in {14th IEEE International On-Line Testing Symposium (IOLTS’08), (Poster)}, 2008.
Oehler, Philipp, et al. “A Modular Memory BIST for Optimized Memory Repair.” {14th IEEE International On-Line Testing Symposium (IOLTS’08), (Poster)}, {IEEE}, 2008, doi:10.1109/iolts.2008.30.

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