A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction

S. Hellebrand, C. G. Zoellin, H.-J. Wunderlich, S. Ludwig, T. Coym, B. Straube, in: {22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT’07)}, {IEEE}, Rome, Italy, 2007, pp. 50–58.

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{22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT'07)}
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50-58
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Hellebrand S, G. Zoellin C, Wunderlich H-J, Ludwig S, Coym T, Straube B. A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction. In: {22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT’07)}. Rome, Italy: {IEEE}; 2007:50-58. doi:10.1109/dft.2007.43
Hellebrand, S., G. Zoellin, C., Wunderlich, H.-J., Ludwig, S., Coym, T., & Straube, B. (2007). A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction. In {22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT’07)} (pp. 50–58). Rome, Italy: {IEEE}. https://doi.org/10.1109/dft.2007.43
@inproceedings{Hellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007, place={Rome, Italy}, title={A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction}, DOI={10.1109/dft.2007.43}, booktitle={{22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT’07)}}, publisher={{IEEE}}, author={Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd}, year={2007}, pages={50–58} }
Hellebrand, Sybille, Christian G. Zoellin, Hans-Joachim Wunderlich, Stefan Ludwig, Torsten Coym, and Bernd Straube. “A Refined Electrical Model for Particle Strikes and Its Impact on SEU Prediction.” In {22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT’07)}, 50–58. Rome, Italy: {IEEE}, 2007. https://doi.org/10.1109/dft.2007.43.
S. Hellebrand, C. G. Zoellin, H.-J. Wunderlich, S. Ludwig, T. Coym, and B. Straube, “A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction,” in {22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT’07)}, 2007, pp. 50–58.
Hellebrand, Sybille, et al. “A Refined Electrical Model for Particle Strikes and Its Impact on SEU Prediction.” {22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT’07)}, {IEEE}, 2007, pp. 50–58, doi:10.1109/dft.2007.43.

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