Data Compression for Multiple Scan Chains Using Dictionaries with Corrections

A. Wuertenberger, C. S. Tautermann, S. Hellebrand, in: {IEEE International Test Conference (ITC’04)}, {IEEE}, Charlotte, NC, USA, 2004, pp. 926–935.

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Conference Paper | English
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{IEEE International Test Conference (ITC'04)}
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926-935
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Wuertenberger A, S. Tautermann C, Hellebrand S. Data Compression for Multiple Scan Chains Using Dictionaries with Corrections. In: {IEEE International Test Conference (ITC’04)}. Charlotte, NC, USA: {IEEE}; 2004:926-935. doi:10.1109/test.2004.1387357
Wuertenberger, A., S. Tautermann, C., & Hellebrand, S. (2004). Data Compression for Multiple Scan Chains Using Dictionaries with Corrections. In {IEEE International Test Conference (ITC’04)} (pp. 926–935). Charlotte, NC, USA: {IEEE}. https://doi.org/10.1109/test.2004.1387357
@inproceedings{Wuertenberger_S. Tautermann_Hellebrand_2004, place={Charlotte, NC, USA}, title={Data Compression for Multiple Scan Chains Using Dictionaries with Corrections}, DOI={10.1109/test.2004.1387357}, booktitle={{IEEE International Test Conference (ITC’04)}}, publisher={{IEEE}}, author={Wuertenberger, Armin and S. Tautermann, Christofer and Hellebrand, Sybille}, year={2004}, pages={926–935} }
Wuertenberger, Armin, Christofer S. Tautermann, and Sybille Hellebrand. “Data Compression for Multiple Scan Chains Using Dictionaries with Corrections.” In {IEEE International Test Conference (ITC’04)}, 926–35. Charlotte, NC, USA: {IEEE}, 2004. https://doi.org/10.1109/test.2004.1387357.
A. Wuertenberger, C. S. Tautermann, and S. Hellebrand, “Data Compression for Multiple Scan Chains Using Dictionaries with Corrections,” in {IEEE International Test Conference (ITC’04)}, 2004, pp. 926–935.
Wuertenberger, Armin, et al. “Data Compression for Multiple Scan Chains Using Dictionaries with Corrections.” {IEEE International Test Conference (ITC’04)}, {IEEE}, 2004, pp. 926–35, doi:10.1109/test.2004.1387357.

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