Data Compression for Multiple Scan Chains Using Dictionaries with Corrections
A. Wuertenberger, C. S. Tautermann, S. Hellebrand, in: IEEE International Test Conference (ITC’04), IEEE, Charlotte, NC, USA, 2004, pp. 926–935.
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Wuertenberger, Armin;
S. Tautermann, Christofer;
Hellebrand, SybilleLibreCat 
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IEEE International Test Conference (ITC'04)
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926-935
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Wuertenberger A, S. Tautermann C, Hellebrand S. Data Compression for Multiple Scan Chains Using Dictionaries with Corrections. In: IEEE International Test Conference (ITC’04). IEEE; 2004:926-935. doi:10.1109/test.2004.1387357
Wuertenberger, A., S. Tautermann, C., & Hellebrand, S. (2004). Data Compression for Multiple Scan Chains Using Dictionaries with Corrections. IEEE International Test Conference (ITC’04), 926–935. https://doi.org/10.1109/test.2004.1387357
@inproceedings{Wuertenberger_S. Tautermann_Hellebrand_2004, place={Charlotte, NC, USA}, title={Data Compression for Multiple Scan Chains Using Dictionaries with Corrections}, DOI={10.1109/test.2004.1387357}, booktitle={IEEE International Test Conference (ITC’04)}, publisher={IEEE}, author={Wuertenberger, Armin and S. Tautermann, Christofer and Hellebrand, Sybille}, year={2004}, pages={926–935} }
Wuertenberger, Armin, Christofer S. Tautermann, and Sybille Hellebrand. “Data Compression for Multiple Scan Chains Using Dictionaries with Corrections.” In IEEE International Test Conference (ITC’04), 926–35. Charlotte, NC, USA: IEEE, 2004. https://doi.org/10.1109/test.2004.1387357.
A. Wuertenberger, C. S. Tautermann, and S. Hellebrand, “Data Compression for Multiple Scan Chains Using Dictionaries with Corrections,” in IEEE International Test Conference (ITC’04), 2004, pp. 926–935, doi: 10.1109/test.2004.1387357.
Wuertenberger, Armin, et al. “Data Compression for Multiple Scan Chains Using Dictionaries with Corrections.” IEEE International Test Conference (ITC’04), IEEE, 2004, pp. 926–35, doi:10.1109/test.2004.1387357.
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