Efficient Online and Offline Testing of Embedded DRAMs

S. Hellebrand, H.-J. Wunderlich, A. A. Ivaniuk, Y. V. Klimets, V. N. Yarmolik, {IEEE Transactions on Computers} 51 (2002) 801–809.

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Journal Article | English
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Journal Title
{IEEE Transactions on Computers}
Volume
51
Issue
7
Page
801-809
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Hellebrand S, Wunderlich H-J, A. Ivaniuk A, V. Klimets Y, N. Yarmolik V. Efficient Online and Offline Testing of Embedded DRAMs. {IEEE Transactions on Computers}. 2002;51(7):801-809. doi:10.1109/tc.2002.1017700
Hellebrand, S., Wunderlich, H.-J., A. Ivaniuk, A., V. Klimets, Y., & N. Yarmolik, V. (2002). Efficient Online and Offline Testing of Embedded DRAMs. {IEEE Transactions on Computers}, 51(7), 801–809. https://doi.org/10.1109/tc.2002.1017700
@article{Hellebrand_Wunderlich_A. Ivaniuk_V. Klimets_N. Yarmolik_2002, title={Efficient Online and Offline Testing of Embedded DRAMs}, volume={51}, DOI={10.1109/tc.2002.1017700}, number={7}, journal={{IEEE Transactions on Computers}}, publisher={Institute of Electrical and Electronics Engineers ({IEEE})}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and A. Ivaniuk, Alexander and V. Klimets, Yuri and N. Yarmolik, Vyacheslav}, year={2002}, pages={801–809} }
Hellebrand, Sybille, Hans-Joachim Wunderlich, Alexander A. Ivaniuk, Yuri V. Klimets, and Vyacheslav N. Yarmolik. “Efficient Online and Offline Testing of Embedded DRAMs.” {IEEE Transactions on Computers} 51, no. 7 (2002): 801–9. https://doi.org/10.1109/tc.2002.1017700.
S. Hellebrand, H.-J. Wunderlich, A. A. Ivaniuk, Y. V. Klimets, and V. N. Yarmolik, “Efficient Online and Offline Testing of Embedded DRAMs,” {IEEE Transactions on Computers}, vol. 51, no. 7, pp. 801–809, 2002.
Hellebrand, Sybille, et al. “Efficient Online and Offline Testing of Embedded DRAMs.” {IEEE Transactions on Computers}, vol. 51, no. 7, Institute of Electrical and Electronics Engineers ({IEEE}), 2002, pp. 801–09, doi:10.1109/tc.2002.1017700.

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