Efficient Online and Offline Testing of Embedded DRAMs
S. Hellebrand, H.-J. Wunderlich, A. A. Ivaniuk, Y. V. Klimets, V. N. Yarmolik, IEEE Transactions on Computers 51 (2002) 801–809.
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Journal Article
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Author
Hellebrand, SybilleLibreCat 
;
Wunderlich, Hans-Joachim;
A. Ivaniuk, Alexander;
V. Klimets, Yuri;
N. Yarmolik, Vyacheslav
;
Wunderlich, Hans-Joachim;
A. Ivaniuk, Alexander;
V. Klimets, Yuri;
N. Yarmolik, VyacheslavDepartment
Publishing Year
Journal Title
IEEE Transactions on Computers
Volume
51
Issue
7
Page
801-809
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Cite this
Hellebrand S, Wunderlich H-J, A. Ivaniuk A, V. Klimets Y, N. Yarmolik V. Efficient Online and Offline Testing of Embedded DRAMs. IEEE Transactions on Computers. 2002;51(7):801-809. doi:10.1109/tc.2002.1017700
Hellebrand, S., Wunderlich, H.-J., A. Ivaniuk, A., V. Klimets, Y., & N. Yarmolik, V. (2002). Efficient Online and Offline Testing of Embedded DRAMs. IEEE Transactions on Computers, 51(7), 801–809. https://doi.org/10.1109/tc.2002.1017700
@article{Hellebrand_Wunderlich_A. Ivaniuk_V. Klimets_N. Yarmolik_2002, title={Efficient Online and Offline Testing of Embedded DRAMs}, volume={51}, DOI={10.1109/tc.2002.1017700}, number={7}, journal={IEEE Transactions on Computers}, publisher={IEEE}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and A. Ivaniuk, Alexander and V. Klimets, Yuri and N. Yarmolik, Vyacheslav}, year={2002}, pages={801–809} }
Hellebrand, Sybille, Hans-Joachim Wunderlich, Alexander A. Ivaniuk, Yuri V. Klimets, and Vyacheslav N. Yarmolik. “Efficient Online and Offline Testing of Embedded DRAMs.” IEEE Transactions on Computers 51, no. 7 (2002): 801–9. https://doi.org/10.1109/tc.2002.1017700.
S. Hellebrand, H.-J. Wunderlich, A. A. Ivaniuk, Y. V. Klimets, and V. N. Yarmolik, “Efficient Online and Offline Testing of Embedded DRAMs,” IEEE Transactions on Computers, vol. 51, no. 7, pp. 801–809, 2002, doi: 10.1109/tc.2002.1017700.
Hellebrand, Sybille, et al. “Efficient Online and Offline Testing of Embedded DRAMs.” IEEE Transactions on Computers, vol. 51, no. 7, IEEE, 2002, pp. 801–09, doi:10.1109/tc.2002.1017700.
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