Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST

H.-G. Liang, S. Hellebrand, H.-J. Wunderlich, in: {IEEE International Test Conference (ITC’01)}, {IEEE}, Baltimore, MD, USA, 2001, pp. 894–902.

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{IEEE International Test Conference (ITC'01)}
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894-902
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Liang H-G, Hellebrand S, Wunderlich H-J. Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. In: {IEEE International Test Conference (ITC’01)}. Baltimore, MD, USA: {IEEE}; 2001:894-902. doi:10.1109/test.2001.966712
Liang, H.-G., Hellebrand, S., & Wunderlich, H.-J. (2001). Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. In {IEEE International Test Conference (ITC’01)} (pp. 894–902). Baltimore, MD, USA: {IEEE}. https://doi.org/10.1109/test.2001.966712
@inproceedings{Liang_Hellebrand_Wunderlich_2001, place={Baltimore, MD, USA}, title={Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST}, DOI={10.1109/test.2001.966712}, booktitle={{IEEE International Test Conference (ITC’01)}}, publisher={{IEEE}}, author={Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2001}, pages={894–902} }
Liang, Hua-Guo, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST.” In {IEEE International Test Conference (ITC’01)}, 894–902. Baltimore, MD, USA: {IEEE}, 2001. https://doi.org/10.1109/test.2001.966712.
H.-G. Liang, S. Hellebrand, and H.-J. Wunderlich, “Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST,” in {IEEE International Test Conference (ITC’01)}, 2001, pp. 894–902.
Liang, Hua-Guo, et al. “Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST.” {IEEE International Test Conference (ITC’01)}, {IEEE}, 2001, pp. 894–902, doi:10.1109/test.2001.966712.

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