Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST
H.-G. Liang, S. Hellebrand, H.-J. Wunderlich, in: IEEE International Test Conference (ITC’01), IEEE, Baltimore, MD, USA, 2001, pp. 894–902.
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Liang, Hua-Guo;
Hellebrand, SybilleLibreCat 
;
Wunderlich, Hans-Joachim
;
Wunderlich, Hans-JoachimDepartment
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IEEE International Test Conference (ITC'01)
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894-902
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Liang H-G, Hellebrand S, Wunderlich H-J. Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. In: IEEE International Test Conference (ITC’01). IEEE; 2001:894-902. doi:10.1109/test.2001.966712
Liang, H.-G., Hellebrand, S., & Wunderlich, H.-J. (2001). Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. IEEE International Test Conference (ITC’01), 894–902. https://doi.org/10.1109/test.2001.966712
@inproceedings{Liang_Hellebrand_Wunderlich_2001, place={Baltimore, MD, USA}, title={Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST}, DOI={10.1109/test.2001.966712}, booktitle={IEEE International Test Conference (ITC’01)}, publisher={IEEE}, author={Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2001}, pages={894–902} }
Liang, Hua-Guo, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST.” In IEEE International Test Conference (ITC’01), 894–902. Baltimore, MD, USA: IEEE, 2001. https://doi.org/10.1109/test.2001.966712.
H.-G. Liang, S. Hellebrand, and H.-J. Wunderlich, “Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST,” in IEEE International Test Conference (ITC’01), 2001, pp. 894–902, doi: 10.1109/test.2001.966712.
Liang, Hua-Guo, et al. “Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST.” IEEE International Test Conference (ITC’01), IEEE, 2001, pp. 894–902, doi:10.1109/test.2001.966712.
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