A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters

S. Hellebrand, H.-G. Liang, H.-J. Wunderlich, in: {IEEE International Test Conference (ITC’00)}, {IEEE}, Atlantic City, NJ, USA, 2000, pp. 778–784.

Download
No fulltext has been uploaded.
Conference Paper | English
Author
; ;
Publishing Year
Proceedings Title
{IEEE International Test Conference (ITC'00)}
Page
778-784
LibreCat-ID

Cite this

Hellebrand S, Liang H-G, Wunderlich H-J. A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters. In: {IEEE International Test Conference (ITC’00)}. Atlantic City, NJ, USA: {IEEE}; 2000:778-784. doi:10.1109/test.2000.894274
Hellebrand, S., Liang, H.-G., & Wunderlich, H.-J. (2000). A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters. In {IEEE International Test Conference (ITC’00)} (pp. 778–784). Atlantic City, NJ, USA: {IEEE}. https://doi.org/10.1109/test.2000.894274
@inproceedings{Hellebrand_Liang_Wunderlich_2000, place={Atlantic City, NJ, USA}, title={A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters}, DOI={10.1109/test.2000.894274}, booktitle={{IEEE International Test Conference (ITC’00)}}, publisher={{IEEE}}, author={Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim}, year={2000}, pages={778–784} }
Hellebrand, Sybille, Hua-Guo Liang, and Hans-Joachim Wunderlich. “A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters.” In {IEEE International Test Conference (ITC’00)}, 778–84. Atlantic City, NJ, USA: {IEEE}, 2000. https://doi.org/10.1109/test.2000.894274.
S. Hellebrand, H.-G. Liang, and H.-J. Wunderlich, “A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters,” in {IEEE International Test Conference (ITC’00)}, 2000, pp. 778–784.
Hellebrand, Sybille, et al. “A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters.” {IEEE International Test Conference (ITC’00)}, {IEEE}, 2000, pp. 778–84, doi:10.1109/test.2000.894274.

Export

Marked Publications

Open Data LibreCat

Search this title in

Google Scholar