A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters
S. Hellebrand, H.-G. Liang, H.-J. Wunderlich, in: IEEE International Test Conference (ITC’00), IEEE, Atlantic City, NJ, USA, 2000, pp. 778–784.
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Hellebrand, SybilleLibreCat 
;
Liang, Hua-Guo;
Wunderlich, Hans-Joachim
;
Liang, Hua-Guo;
Wunderlich, Hans-JoachimDepartment
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IEEE International Test Conference (ITC'00)
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778-784
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Hellebrand S, Liang H-G, Wunderlich H-J. A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters. In: IEEE International Test Conference (ITC’00). IEEE; 2000:778-784. doi:10.1109/test.2000.894274
Hellebrand, S., Liang, H.-G., & Wunderlich, H.-J. (2000). A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters. IEEE International Test Conference (ITC’00), 778–784. https://doi.org/10.1109/test.2000.894274
@inproceedings{Hellebrand_Liang_Wunderlich_2000, place={Atlantic City, NJ, USA}, title={A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters}, DOI={10.1109/test.2000.894274}, booktitle={IEEE International Test Conference (ITC’00)}, publisher={IEEE}, author={Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim}, year={2000}, pages={778–784} }
Hellebrand, Sybille, Hua-Guo Liang, and Hans-Joachim Wunderlich. “A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters.” In IEEE International Test Conference (ITC’00), 778–84. Atlantic City, NJ, USA: IEEE, 2000. https://doi.org/10.1109/test.2000.894274.
S. Hellebrand, H.-G. Liang, and H.-J. Wunderlich, “A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters,” in IEEE International Test Conference (ITC’00), 2000, pp. 778–784, doi: 10.1109/test.2000.894274.
Hellebrand, Sybille, et al. “A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters.” IEEE International Test Conference (ITC’00), IEEE, 2000, pp. 778–84, doi:10.1109/test.2000.894274.
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