Fast Self-Recovering Controllers
A. Hertwig, S. Hellebrand, H.-J. Wunderlich, in: 16th IEEE VLSI Test Symposium (VTS’98), IEEE, Monterey, CA, USA, 1998, pp. 296–302.
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Hertwig, Andre;
Hellebrand, SybilleLibreCat ;
Wunderlich, Hans-Joachim
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16th IEEE VLSI Test Symposium (VTS'98)
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296-302
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Hertwig A, Hellebrand S, Wunderlich H-J. Fast Self-Recovering Controllers. In: 16th IEEE VLSI Test Symposium (VTS’98). IEEE; 1998:296-302. doi:10.1109/vtest.1998.670883
Hertwig, A., Hellebrand, S., & Wunderlich, H.-J. (1998). Fast Self-Recovering Controllers. 16th IEEE VLSI Test Symposium (VTS’98), 296–302. https://doi.org/10.1109/vtest.1998.670883
@inproceedings{Hertwig_Hellebrand_Wunderlich_1998, place={Monterey, CA, USA}, title={Fast Self-Recovering Controllers}, DOI={10.1109/vtest.1998.670883}, booktitle={16th IEEE VLSI Test Symposium (VTS’98)}, publisher={IEEE}, author={Hertwig, Andre and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={1998}, pages={296–302} }
Hertwig, Andre, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Fast Self-Recovering Controllers.” In 16th IEEE VLSI Test Symposium (VTS’98), 296–302. Monterey, CA, USA: IEEE, 1998. https://doi.org/10.1109/vtest.1998.670883.
A. Hertwig, S. Hellebrand, and H.-J. Wunderlich, “Fast Self-Recovering Controllers,” in 16th IEEE VLSI Test Symposium (VTS’98), 1998, pp. 296–302, doi: 10.1109/vtest.1998.670883.
Hertwig, Andre, et al. “Fast Self-Recovering Controllers.” 16th IEEE VLSI Test Symposium (VTS’98), IEEE, 1998, pp. 296–302, doi:10.1109/vtest.1998.670883.