STARBIST: Scan Autocorrelated Random Pattern Generation

K.-H. Tsai, S. Hellebrand, M. Marek-Sadowska, J. Rajski, in: {34th ACM/IEEE Design Automation Conference (DAC’97)}, {IEEE}, Anaheim, CA, USA, 1997.

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{34th ACM/IEEE Design Automation Conference (DAC'97)}
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Tsai K-H, Hellebrand S, Marek-Sadowska M, Rajski J. STARBIST: Scan Autocorrelated Random Pattern Generation. In: {34th ACM/IEEE Design Automation Conference (DAC’97)}. Anaheim, CA, USA: {IEEE}; 1997. doi:10.1109/dac.1997.597194
Tsai, K.-H., Hellebrand, S., Marek-Sadowska, M., & Rajski, J. (1997). STARBIST: Scan Autocorrelated Random Pattern Generation. In {34th ACM/IEEE Design Automation Conference (DAC’97)}. Anaheim, CA, USA: {IEEE}. https://doi.org/10.1109/dac.1997.597194
@inproceedings{Tsai_Hellebrand_Marek-Sadowska_Rajski_1997, place={Anaheim, CA, USA}, title={STARBIST: Scan Autocorrelated Random Pattern Generation}, DOI={10.1109/dac.1997.597194}, booktitle={{34th ACM/IEEE Design Automation Conference (DAC’97)}}, publisher={{IEEE}}, author={Tsai, Kun-Han and Hellebrand, Sybille and Marek-Sadowska, Malgorzata and Rajski, Janusz}, year={1997} }
Tsai, Kun-Han, Sybille Hellebrand, Malgorzata Marek-Sadowska, and Janusz Rajski. “STARBIST: Scan Autocorrelated Random Pattern Generation.” In {34th ACM/IEEE Design Automation Conference (DAC’97)}. Anaheim, CA, USA: {IEEE}, 1997. https://doi.org/10.1109/dac.1997.597194.
K.-H. Tsai, S. Hellebrand, M. Marek-Sadowska, and J. Rajski, “STARBIST: Scan Autocorrelated Random Pattern Generation,” in {34th ACM/IEEE Design Automation Conference (DAC’97)}, 1997.
Tsai, Kun-Han, et al. “STARBIST: Scan Autocorrelated Random Pattern Generation.” {34th ACM/IEEE Design Automation Conference (DAC’97)}, {IEEE}, 1997, doi:10.1109/dac.1997.597194.

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