STARBIST: Scan Autocorrelated Random Pattern Generation
K.-H. Tsai, S. Hellebrand, M. Marek-Sadowska, J. Rajski, in: 34th ACM/IEEE Design Automation Conference (DAC’97), IEEE, Anaheim, CA, USA, 1997.
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Tsai, Kun-Han;
Hellebrand, SybilleLibreCat 
;
Marek-Sadowska, Malgorzata;
Rajski, Janusz
;
Marek-Sadowska, Malgorzata;
Rajski, JanuszDepartment
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34th ACM/IEEE Design Automation Conference (DAC'97)
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Tsai K-H, Hellebrand S, Marek-Sadowska M, Rajski J. STARBIST: Scan Autocorrelated Random Pattern Generation. In: 34th ACM/IEEE Design Automation Conference (DAC’97). IEEE; 1997. doi:10.1109/dac.1997.597194
Tsai, K.-H., Hellebrand, S., Marek-Sadowska, M., & Rajski, J. (1997). STARBIST: Scan Autocorrelated Random Pattern Generation. 34th ACM/IEEE Design Automation Conference (DAC’97). https://doi.org/10.1109/dac.1997.597194
@inproceedings{Tsai_Hellebrand_Marek-Sadowska_Rajski_1997, place={Anaheim, CA, USA}, title={STARBIST: Scan Autocorrelated Random Pattern Generation}, DOI={10.1109/dac.1997.597194}, booktitle={34th ACM/IEEE Design Automation Conference (DAC’97)}, publisher={IEEE}, author={Tsai, Kun-Han and Hellebrand, Sybille and Marek-Sadowska, Malgorzata and Rajski, Janusz}, year={1997} }
Tsai, Kun-Han, Sybille Hellebrand, Malgorzata Marek-Sadowska, and Janusz Rajski. “STARBIST: Scan Autocorrelated Random Pattern Generation.” In 34th ACM/IEEE Design Automation Conference (DAC’97). Anaheim, CA, USA: IEEE, 1997. https://doi.org/10.1109/dac.1997.597194.
K.-H. Tsai, S. Hellebrand, M. Marek-Sadowska, and J. Rajski, “STARBIST: Scan Autocorrelated Random Pattern Generation,” 1997, doi: 10.1109/dac.1997.597194.
Tsai, Kun-Han, et al. “STARBIST: Scan Autocorrelated Random Pattern Generation.” 34th ACM/IEEE Design Automation Conference (DAC’97), IEEE, 1997, doi:10.1109/dac.1997.597194.
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