Mixed-Mode BIST Using Embedded Processors

S. Hellebrand, H.-J. Wunderlich, A. Hertwig, in: {IEEE International Test Conference (ITC’96)}, {IEEE}, Washington, DC, USA, 1996, pp. 195–204.

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{IEEE International Test Conference (ITC'96)}
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195-204
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Hellebrand S, Wunderlich H-J, Hertwig A. Mixed-Mode BIST Using Embedded Processors. In: {IEEE International Test Conference (ITC’96)}. Washington, DC, USA: {IEEE}; 1996:195-204. doi:10.1109/test.1996.556962
Hellebrand, S., Wunderlich, H.-J., & Hertwig, A. (1996). Mixed-Mode BIST Using Embedded Processors. In {IEEE International Test Conference (ITC’96)} (pp. 195–204). Washington, DC, USA: {IEEE}. https://doi.org/10.1109/test.1996.556962
@inproceedings{Hellebrand_Wunderlich_Hertwig_1996, place={Washington, DC, USA}, title={Mixed-Mode BIST Using Embedded Processors}, DOI={10.1109/test.1996.556962}, booktitle={{IEEE International Test Conference (ITC’96)}}, publisher={{IEEE}}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and Hertwig, Andre}, year={1996}, pages={195–204} }
Hellebrand, Sybille, Hans-Joachim Wunderlich, and Andre Hertwig. “Mixed-Mode BIST Using Embedded Processors.” In {IEEE International Test Conference (ITC’96)}, 195–204. Washington, DC, USA: {IEEE}, 1996. https://doi.org/10.1109/test.1996.556962.
S. Hellebrand, H.-J. Wunderlich, and A. Hertwig, “Mixed-Mode BIST Using Embedded Processors,” in {IEEE International Test Conference (ITC’96)}, 1996, pp. 195–204.
Hellebrand, Sybille, et al. “Mixed-Mode BIST Using Embedded Processors.” {IEEE International Test Conference (ITC’96)}, {IEEE}, 1996, pp. 195–204, doi:10.1109/test.1996.556962.

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