Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers
S. Hellebrand, S. Tarnick, J. Rajski, B. Courtois, in: IEEE International Test Conference (ITC’92), IEEE, Baltimore, MD, USA, 1992, pp. 120–129.
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Hellebrand, SybilleLibreCat 
;
Tarnick, Steffen;
Rajski, Janusz;
Courtois, Bernard
;
Tarnick, Steffen;
Rajski, Janusz;
Courtois, BernardDepartment
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IEEE International Test Conference (ITC'92)
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120-129
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Hellebrand S, Tarnick S, Rajski J, Courtois B. Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. In: IEEE International Test Conference (ITC’92). IEEE; 1992:120-129. doi:10.1109/test.1992.527812
Hellebrand, S., Tarnick, S., Rajski, J., & Courtois, B. (1992). Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. IEEE International Test Conference (ITC’92), 120–129. https://doi.org/10.1109/test.1992.527812
@inproceedings{Hellebrand_Tarnick_Rajski_Courtois_1992, place={Baltimore, MD, USA}, title={Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers}, DOI={10.1109/test.1992.527812}, booktitle={IEEE International Test Conference (ITC’92)}, publisher={IEEE}, author={Hellebrand, Sybille and Tarnick, Steffen and Rajski, Janusz and Courtois, Bernard}, year={1992}, pages={120–129} }
Hellebrand, Sybille, Steffen Tarnick, Janusz Rajski, and Bernard Courtois. “Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers.” In IEEE International Test Conference (ITC’92), 120–29. Baltimore, MD, USA: IEEE, 1992. https://doi.org/10.1109/test.1992.527812.
S. Hellebrand, S. Tarnick, J. Rajski, and B. Courtois, “Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers,” in IEEE International Test Conference (ITC’92), 1992, pp. 120–129, doi: 10.1109/test.1992.527812.
Hellebrand, Sybille, et al. “Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers.” IEEE International Test Conference (ITC’92), IEEE, 1992, pp. 120–29, doi:10.1109/test.1992.527812.
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