Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers

S. Hellebrand, S. Tarnick, J. Rajski, B. Courtois, in: {IEEE International Test Conference (ITC’92)}, {IEEE}, Baltimore, MD, USA, 1992, pp. 120–129.

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{IEEE International Test Conference (ITC'92)}
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120-129
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Hellebrand S, Tarnick S, Rajski J, Courtois B. Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. In: {IEEE International Test Conference (ITC’92)}. Baltimore, MD, USA: {IEEE}; 1992:120-129. doi:10.1109/test.1992.527812
Hellebrand, S., Tarnick, S., Rajski, J., & Courtois, B. (1992). Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. In {IEEE International Test Conference (ITC’92)} (pp. 120–129). Baltimore, MD, USA: {IEEE}. https://doi.org/10.1109/test.1992.527812
@inproceedings{Hellebrand_Tarnick_Rajski_Courtois_1992, place={Baltimore, MD, USA}, title={Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers}, DOI={10.1109/test.1992.527812}, booktitle={{IEEE International Test Conference (ITC’92)}}, publisher={{IEEE}}, author={Hellebrand, Sybille and Tarnick, Steffen and Rajski, Janusz and Courtois, Bernard}, year={1992}, pages={120–129} }
Hellebrand, Sybille, Steffen Tarnick, Janusz Rajski, and Bernard Courtois. “Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers.” In {IEEE International Test Conference (ITC’92)}, 120–29. Baltimore, MD, USA: {IEEE}, 1992. https://doi.org/10.1109/test.1992.527812.
S. Hellebrand, S. Tarnick, J. Rajski, and B. Courtois, “Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers,” in {IEEE International Test Conference (ITC’92)}, 1992, pp. 120–129.
Hellebrand, Sybille, et al. “Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers.” {IEEE International Test Conference (ITC’92)}, {IEEE}, 1992, pp. 120–29, doi:10.1109/test.1992.527812.

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