The Pseudoexhaustive Test of Sequential Circuits
H.-J. Wunderlich, S. Hellebrand, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD) 11 (1992) 26–33.
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Author
Wunderlich, Hans-Joachim;
Hellebrand, SybilleLibreCat 
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Journal Title
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)
Volume
11
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1
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26-33
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Wunderlich H-J, Hellebrand S. The Pseudoexhaustive Test of Sequential Circuits. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD). 1992;11(1):26-33. doi:10.1109/43.108616
Wunderlich, H.-J., & Hellebrand, S. (1992). The Pseudoexhaustive Test of Sequential Circuits. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 11(1), 26–33. https://doi.org/10.1109/43.108616
@article{Wunderlich_Hellebrand_1992, title={The Pseudoexhaustive Test of Sequential Circuits}, volume={11}, DOI={10.1109/43.108616}, number={1}, journal={IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Wunderlich, Hans-Joachim and Hellebrand, Sybille}, year={1992}, pages={26–33} }
Wunderlich, Hans-Joachim, and Sybille Hellebrand. “The Pseudoexhaustive Test of Sequential Circuits.” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD) 11, no. 1 (1992): 26–33. https://doi.org/10.1109/43.108616.
H.-J. Wunderlich and S. Hellebrand, “The Pseudoexhaustive Test of Sequential Circuits,” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), vol. 11, no. 1, pp. 26–33, 1992, doi: 10.1109/43.108616.
Wunderlich, Hans-Joachim, and Sybille Hellebrand. “The Pseudoexhaustive Test of Sequential Circuits.” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), vol. 11, no. 1, Institute of Electrical and Electronics Engineers (IEEE), 1992, pp. 26–33, doi:10.1109/43.108616.
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