Generating Pseudo-Exhaustive Vectors for External Testing
S. Hellebrand, H.-J. Wunderlich, O. F. Haberl, in: IEEE International Test Conference (ITC’90), IEEE, Washington, DC, USA, 1990, pp. 670–679.
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Hellebrand, SybilleLibreCat 
;
Wunderlich, Hans-Joachim;
F. Haberl, Oliver
;
Wunderlich, Hans-Joachim;
F. Haberl, OliverDepartment
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IEEE International Test Conference (ITC'90)
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670-679
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Hellebrand S, Wunderlich H-J, F. Haberl O. Generating Pseudo-Exhaustive Vectors for External Testing. In: IEEE International Test Conference (ITC’90). IEEE; 1990:670-679. doi:10.1109/test.1990.114082
Hellebrand, S., Wunderlich, H.-J., & F. Haberl, O. (1990). Generating Pseudo-Exhaustive Vectors for External Testing. IEEE International Test Conference (ITC’90), 670–679. https://doi.org/10.1109/test.1990.114082
@inproceedings{Hellebrand_Wunderlich_F. Haberl_1990, place={Washington, DC, USA}, title={Generating Pseudo-Exhaustive Vectors for External Testing}, DOI={10.1109/test.1990.114082}, booktitle={IEEE International Test Conference (ITC’90)}, publisher={IEEE}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and F. Haberl, Oliver}, year={1990}, pages={670–679} }
Hellebrand, Sybille, Hans-Joachim Wunderlich, and Oliver F. Haberl. “Generating Pseudo-Exhaustive Vectors for External Testing.” In IEEE International Test Conference (ITC’90), 670–79. Washington, DC, USA: IEEE, 1990. https://doi.org/10.1109/test.1990.114082.
S. Hellebrand, H.-J. Wunderlich, and O. F. Haberl, “Generating Pseudo-Exhaustive Vectors for External Testing,” in IEEE International Test Conference (ITC’90), 1990, pp. 670–679, doi: 10.1109/test.1990.114082.
Hellebrand, Sybille, et al. “Generating Pseudo-Exhaustive Vectors for External Testing.” IEEE International Test Conference (ITC’90), IEEE, 1990, pp. 670–79, doi:10.1109/test.1990.114082.
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