Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits

H.-J. Wunderlich, S. Hellebrand, in: {18th International Symposium on Fault-Tolerant Computing, FTCS-18}, {IEEE (Comput. Soc. Press)}, Tokyo, Japan, 1988, pp. 36–45.

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{18th International Symposium on Fault-Tolerant Computing, FTCS-18}
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Wunderlich H-J, Hellebrand S. Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits. In: {18th International Symposium on Fault-Tolerant Computing, FTCS-18}. Tokyo, Japan: {IEEE (Comput. Soc. Press)}; 1988:36-45. doi:10.1109/ftcs.1988.5294
Wunderlich, H.-J., & Hellebrand, S. (1988). Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits. In {18th International Symposium on Fault-Tolerant Computing, FTCS-18} (pp. 36–45). Tokyo, Japan: {IEEE (Comput. Soc. Press)}. https://doi.org/10.1109/ftcs.1988.5294
@inproceedings{Wunderlich_Hellebrand_1988, place={Tokyo, Japan}, title={Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits}, DOI={10.1109/ftcs.1988.5294}, booktitle={{18th International Symposium on Fault-Tolerant Computing, FTCS-18}}, publisher={{IEEE (Comput. Soc. Press)}}, author={Wunderlich, Hans-Joachim and Hellebrand, Sybille}, year={1988}, pages={36–45} }
Wunderlich, Hans-Joachim, and Sybille Hellebrand. “Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits.” In {18th International Symposium on Fault-Tolerant Computing, FTCS-18}, 36–45. Tokyo, Japan: {IEEE (Comput. Soc. Press)}, 1988. https://doi.org/10.1109/ftcs.1988.5294.
H.-J. Wunderlich and S. Hellebrand, “Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits,” in {18th International Symposium on Fault-Tolerant Computing, FTCS-18}, 1988, pp. 36–45.
Wunderlich, Hans-Joachim, and Sybille Hellebrand. “Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits.” {18th International Symposium on Fault-Tolerant Computing, FTCS-18}, {IEEE (Comput. Soc. Press)}, 1988, pp. 36–45, doi:10.1109/ftcs.1988.5294.

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