Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits
H.-J. Wunderlich, S. Hellebrand, in: 18th International Symposium on Fault-Tolerant Computing, FTCS-18, Tokyo, Japan, 1988, pp. 36–45.
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Wunderlich, Hans-Joachim;
Hellebrand, SybilleLibreCat 
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18th International Symposium on Fault-Tolerant Computing, FTCS-18
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Wunderlich H-J, Hellebrand S. Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits. In: 18th International Symposium on Fault-Tolerant Computing, FTCS-18. ; 1988:36-45. doi:10.1109/ftcs.1988.5294
Wunderlich, H.-J., & Hellebrand, S. (1988). Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits. 18th International Symposium on Fault-Tolerant Computing, FTCS-18, 36–45. https://doi.org/10.1109/ftcs.1988.5294
@inproceedings{Wunderlich_Hellebrand_1988, place={Tokyo, Japan}, title={Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits}, DOI={10.1109/ftcs.1988.5294}, booktitle={18th International Symposium on Fault-Tolerant Computing, FTCS-18}, author={Wunderlich, Hans-Joachim and Hellebrand, Sybille}, year={1988}, pages={36–45} }
Wunderlich, Hans-Joachim, and Sybille Hellebrand. “Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits.” In 18th International Symposium on Fault-Tolerant Computing, FTCS-18, 36–45. Tokyo, Japan, 1988. https://doi.org/10.1109/ftcs.1988.5294.
H.-J. Wunderlich and S. Hellebrand, “Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits,” in 18th International Symposium on Fault-Tolerant Computing, FTCS-18, 1988, pp. 36–45, doi: 10.1109/ftcs.1988.5294.
Wunderlich, Hans-Joachim, and Sybille Hellebrand. “Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits.” 18th International Symposium on Fault-Tolerant Computing, FTCS-18, 1988, pp. 36–45, doi:10.1109/ftcs.1988.5294.
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