Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST

S. Hellebrand, H.-G. Liang, H.-J. Wunderlich, {Journal of Electronic Testing - Theory and Applications (JETTA)} 18 (2002) 157–168.

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Journal Article | English
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Journal Title
{Journal of Electronic Testing - Theory and Applications (JETTA)}
Volume
18
Issue
2
Page
157-168
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Hellebrand S, Liang H-G, Wunderlich H-J. Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. {Journal of Electronic Testing - Theory and Applications (JETTA)}. 2002;18(2):157-168.
Hellebrand, S., Liang, H.-G., & Wunderlich, H.-J. (2002). Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. {Journal of Electronic Testing - Theory and Applications (JETTA)}, 18(2), 157–168.
@article{Hellebrand_Liang_Wunderlich_2002, title={Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST}, volume={18}, number={2}, journal={{Journal of Electronic Testing - Theory and Applications (JETTA)}}, author={Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim}, year={2002}, pages={157–168} }
Hellebrand, Sybille, Hua-Guo Liang, and Hans-Joachim Wunderlich. “Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST.” {Journal of Electronic Testing - Theory and Applications (JETTA)} 18, no. 2 (2002): 157–68.
S. Hellebrand, H.-G. Liang, and H.-J. Wunderlich, “Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST,” {Journal of Electronic Testing - Theory and Applications (JETTA)}, vol. 18, no. 2, pp. 157–168, 2002.
Hellebrand, Sybille, et al. “Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST.” {Journal of Electronic Testing - Theory and Applications (JETTA)}, vol. 18, no. 2, 2002, pp. 157–68.

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