Pattern Generation for a Deterministic BIST Scheme

S. Hellebrand, B. Reeb, S. Tarnick, H.-J. Wunderlich, Pattern Generation for a Deterministic BIST Scheme, 2nd IEEE International Test Synthesis Workshop, Santa Barbara, CA, 1995.

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Hellebrand S, Reeb B, Tarnick S, Wunderlich H-J. Pattern Generation for a Deterministic BIST Scheme. 2nd IEEE International Test Synthesis Workshop, Santa Barbara, CA; 1995.
Hellebrand, S., Reeb, B., Tarnick, S., & Wunderlich, H.-J. (1995). Pattern Generation for a Deterministic BIST Scheme. 2nd IEEE International Test Synthesis Workshop, Santa Barbara, CA.
@book{Hellebrand_Reeb_Tarnick_Wunderlich_1995, place={2nd IEEE International Test Synthesis Workshop, Santa Barbara, CA}, title={Pattern Generation for a Deterministic BIST Scheme}, author={Hellebrand, Sybille and Reeb, Birgit and Tarnick, Steffen and Wunderlich, Hans-Joachim}, year={1995} }
Hellebrand, Sybille, Birgit Reeb, Steffen Tarnick, and Hans-Joachim Wunderlich. Pattern Generation for a Deterministic BIST Scheme. 2nd IEEE International Test Synthesis Workshop, Santa Barbara, CA, 1995.
S. Hellebrand, B. Reeb, S. Tarnick, and H.-J. Wunderlich, Pattern Generation for a Deterministic BIST Scheme. 2nd IEEE International Test Synthesis Workshop, Santa Barbara, CA, 1995.
Hellebrand, Sybille, et al. Pattern Generation for a Deterministic BIST Scheme. 1995.

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