STARBIST: Scan Autocorrelated Random Pattern Generation
K.-H. Tsai, S. Hellebrand, J. Rajski, M. Marek-Sadowska, STARBIST: Scan Autocorrelated Random Pattern Generation, 4th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, 1997.
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Tsai, Kun-Han;
Hellebrand, SybilleLibreCat 
;
Rajski, Janusz;
Marek-Sadowska, Malgorzata
;
Rajski, Janusz;
Marek-Sadowska, MalgorzataDepartment
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Tsai K-H, Hellebrand S, Rajski J, Marek-Sadowska M. STARBIST: Scan Autocorrelated Random Pattern Generation. 4th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA; 1997.
Tsai, K.-H., Hellebrand, S., Rajski, J., & Marek-Sadowska, M. (1997). STARBIST: Scan Autocorrelated Random Pattern Generation. 4th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA.
@book{Tsai_Hellebrand_Rajski_Marek-Sadowska_1997, place={4th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA}, title={STARBIST: Scan Autocorrelated Random Pattern Generation}, author={Tsai, Kun-Han and Hellebrand, Sybille and Rajski, Janusz and Marek-Sadowska, Malgorzata}, year={1997} }
Tsai, Kun-Han, Sybille Hellebrand, Janusz Rajski, and Malgorzata Marek-Sadowska. STARBIST: Scan Autocorrelated Random Pattern Generation. 4th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, 1997.
K.-H. Tsai, S. Hellebrand, J. Rajski, and M. Marek-Sadowska, STARBIST: Scan Autocorrelated Random Pattern Generation. 4th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, 1997.
Tsai, Kun-Han, et al. STARBIST: Scan Autocorrelated Random Pattern Generation. 1997.
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