Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST

H.-G. Liang, S. Hellebrand, H.-J. Wunderlich, Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST, IEEE European Test Workshop, Stockholm, Sweden, 2001.

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Liang H-G, Hellebrand S, Wunderlich H-J. Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. IEEE European Test Workshop, Stockholm, Sweden; 2001.
Liang, H.-G., Hellebrand, S., & Wunderlich, H.-J. (2001). Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. IEEE European Test Workshop, Stockholm, Sweden.
@book{Liang_Hellebrand_Wunderlich_2001, place={IEEE European Test Workshop, Stockholm, Sweden}, title={Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST}, author={Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2001} }
Liang, Hua-Guo, Sybille Hellebrand, and Hans-Joachim Wunderlich. Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. IEEE European Test Workshop, Stockholm, Sweden, 2001.
H.-G. Liang, S. Hellebrand, and H.-J. Wunderlich, Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. IEEE European Test Workshop, Stockholm, Sweden, 2001.
Liang, Hua-Guo, et al. Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. 2001.

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