Regret analysis for performance metrics in multi-label classification: The case of Hamming and subset zero-one loss
K. Dembczynski, W. Waegeman, W. Cheng, E. Hüllermeier, in: In Proceedings ECML/PKDD-2010, European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases, ,Bareclona, Spain, 2010.
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Dembczynski, K.;
Waegeman, W.;
Cheng, W.;
Hüllermeier, EykeLibreCat
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In Proceedings ECML/PKDD-2010, European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases, ,Bareclona, Spain
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Dembczynski K, Waegeman W, Cheng W, Hüllermeier E. Regret analysis for performance metrics in multi-label classification: The case of Hamming and subset zero-one loss. In: In Proceedings ECML/PKDD-2010, European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases, ,Bareclona, Spain. ; 2010.
Dembczynski, K., Waegeman, W., Cheng, W., & Hüllermeier, E. (2010). Regret analysis for performance metrics in multi-label classification: The case of Hamming and subset zero-one loss. In In Proceedings ECML/PKDD-2010, European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases, ,Bareclona, Spain.
@inproceedings{Dembczynski_Waegeman_Cheng_Hüllermeier_2010, title={Regret analysis for performance metrics in multi-label classification: The case of Hamming and subset zero-one loss}, booktitle={In Proceedings ECML/PKDD-2010, European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases, ,Bareclona, Spain}, author={Dembczynski, K. and Waegeman, W. and Cheng, W. and Hüllermeier, Eyke}, year={2010} }
Dembczynski, K., W. Waegeman, W. Cheng, and Eyke Hüllermeier. “Regret Analysis for Performance Metrics in Multi-Label Classification: The Case of Hamming and Subset Zero-One Loss.” In In Proceedings ECML/PKDD-2010, European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases, ,Bareclona, Spain, 2010.
K. Dembczynski, W. Waegeman, W. Cheng, and E. Hüllermeier, “Regret analysis for performance metrics in multi-label classification: The case of Hamming and subset zero-one loss,” in In Proceedings ECML/PKDD-2010, European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases, ,Bareclona, Spain, 2010.
Dembczynski, K., et al. “Regret Analysis for Performance Metrics in Multi-Label Classification: The Case of Hamming and Subset Zero-One Loss.” In Proceedings ECML/PKDD-2010, European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases, ,Bareclona, Spain, 2010.
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